Used RIGAKU 3750 #293601029 for sale

RIGAKU 3750
Manufacturer
RIGAKU
Model
3750
ID: 293601029
X-Ray system.
RIGAKU 3750 is a X-ray diffractometer equipment designed to perform X-ray diffraction measurements for a variety of materials including metals, polymers, ceramics, alloys, and composites. The system is composed of two main components: an X-ray source, and a detector. The X-ray source emits a beam of X-rays at different wavelengths, and the detector collects data on the diffracted X-rays which are then analyzed by the software to determine the crystalline structure of the analyzed material. The X-ray source used in 3750 is a 25kW gearless X-ray source which is capable of producing a powerful and stable X-ray beam. The X-ray beam has an adjustable take-off angle which allows users to select the optimal angle to best resolve their material's crystalline structure. The detector used in RIGAKU 3750 is a Pilatus 300K Pixel Detector with a Theta/2Theta 0.02° step size, which is capable of detecting up to 100 peaks. 3750 unit is designed for data collection with an automatic sample changer for up to 24 samples. The machine is also compatible with SCX - Single Cone XRD, allowing for the analysis of large, awkward samples like those extracted from catenation sites. Additionally, RIGAKU 3750 has the capability to achieve low resolution and fast scanning measurements, as well as atypical diffraction (ATD), darkfield measurement, any 5-axis goniometers, DCM (Digital signal/image comparison), polarization optics, as well as a wide range of accessories. Thanks to its features and components, 3750 can be used to perform a wide range of X-ray measurements. These include X-ray diffraction (XRD), X-ray Fluorescence (XRF), as well as micro- and nano-characterization. It can be used for the analysis of materials such as metals, alloys, semiconductors, polymers, layers, and coatings. Overall, RIGAKU 3750 is a powerful and flexible X-ray diffractometer tool which is suitable for a wide range of industries and applications. Its accurate data acquisition, advanced array of features and accessories, as well as the various X-ray diffraction analysis it can perform, make it an ideal choice for many users.
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