Used RIGAKU 3750 #9091967 for sale

RIGAKU 3750 is an X-ray diffraction equipment designed for advanced research applications. The system is capable of measuring both powder and single crystal samples, as well as standard diffraction work such as phase identification and structural refinement. The unit includes a highly precise X-ray generator, closed-loop goniometer, and position sensitive X-ray detector, all integrated into an ergonomic mechanical design with precision control of sample positioning. 3750 begins with the X-ray generator. Using a fixed 40 kV voltage, up to 10 mA current, it produces a stable X-ray diffraction pattern with sharp peaks. The X-ray source has a small, adjustable spot size of 0.1mm, which can be used to focus on small regions of a sample for accurate results. The X-ray generator can be cooled to increase stability, while a shutter mechanism prevents irradiation of personnel. The diffracted X-rays are then detected by the position sensitive X-ray detector, which is capable of delivering data with an accuracy of 0.01°/step. The detector contains an imaging area of 20 x 20 mm for the detection of Bragg peak positions, and a CCD sensor for the analysis of angular diffraction data. The detector also includes an integrated image intensifier for the acquisition of in-situ images. The goniometer is the key component that allows for precise sample positioning and alignment. The motorized goniometer contains a precise sample stage and X-ray source with six degrees of freedom which can be moved independently or in combination to bring the X-ray beam and sample into the interaction region. A precise encoder-sensor machine allows for accurate control of the sample stage, with 0.01° resolution for the angular axes. RIGAKU 3750 tool integrates all of these components into an ergonomically designed, mechanical package. The asset is easy to use and can be operated remotely or with manual control. The interface is designed for efficient manipulation of the X-ray beam and sample position, which significantly reduces time-to-result. In conclusion, 3750 is a powerful X-ray model that is designed for advanced research applications. It provides the precision and stability necessary for accurate diffraction data, as well as a reliable and efficient interface for the manipulation of the X-ray beam and sample stage.