Used RIGAKU MFM310 #9251835 for sale

Name: RIGAKU MFM310
Brand: RIGAKU
SKU: 9251835
Availability: SoldOut

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X-ray

Manufacturer

RIGAKU

Model

MFM310

ID: 9251835

Wafer Size: 12"

X-Ray Reflectivity (XRR), 12" XRR X-Ray generator Automatic wafer handling robot system, 8"-12" With wafer handling capability and wafer pre-aligner (2) FOUP Load Ports, 12" With FOUP ID Readers Beam module: Cu colors beam Mo colors beam Sample stage With vacuum chuck, 8"-12" Computer controlled stage motion for X, Y, 0 and Z-Axis Precise goniometer With sensing optical encorder system Control and data processing system: Control computer Operating system: Windows XP LCD Monitor Air cooling chiller Center chip Isolated stone base for optic mechanism Anti-vibration structure COGNEX Pattern recognition.

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RIGAKU MFM310 is an X-ray metrology tool for industrial applications. It is a state-of-the-art X-ray imaging system that provides high-resolution, large-field images. It is designed to quickly measure and accurately characterize a wide variety of samples. The system is built with several advanced detection and imaging technologies for maximum precision and reliability. RIGAKU MFM 310 is built with a wide range of components, such as X-ray detector modules, a xenon tube, and a tower. The detector modules are used to detect X-ray radiation and produce a high resolution image. The xenon tube is a high-power source of X-ray radiation that is used to irradiate the sample. The tower is a support structure that is used to hold the components in place and ensure proper alignment. MFM310 uses two different methods for imaging: point sensing and whole-field imaging. In point sensing, the detector measures the number of X-ray photons generated by the sample. In whole-field imaging, both the size and position of features in the sample are imaged at the same time. This allows for more precise measurements. MFM 310 offers a wide variety of spectroscopy options as well, including Raman scattering spectroscopy and Fourier transform infrared spectroscopy. These techniques are used to measure the composition of samples and to determine how they interact with different forms of radiation. In addition, RIGAKU MFM310 offers advanced resolution and signal-to-noise ratio (SNR) capabilities to ensure accurate analysis and results. The system can detect features as small as 0.5 micrometers and has an SNR of more than 100,000:1. This makes it possible to capture intricate details and measure even very small features with precision. Overall, RIGAKU MFM 310 is an advanced X-ray metrology tool for industrial applications. It provides high-resolution, large-field images with advanced detection and imaging technologies. It also offers wide spectroscopy capabilities, high resolution and SNR capabilities, and more, making it an ideal choice for users.