Used RIGAKU MFM65 #9234626 for sale

RIGAKU MFM65 is a high-performance X-ray diffraction equipment designed to provide high-resolution measurements of X-ray diffraction data. The system is used to acquire X-ray diffraction data on a variety of materials, including powders, single crystals, thin films, and interface structures. The unit includes an adjustable-geometry X-ray source, a monochromator for producing the desired X-ray beam characteristics, a sample chamber for housing the samples to be diffracted, a detector for measuring the scattered X-rays, and a data acquisition machine for collecting and analyzing the data. The adjustable geometry X-ray source can be used to produce X-rays in the angular range from 30-160°. The high-energy X-ray source is lead shielded and can be adjusted to provide variable flux and X-ray energies over the range from 8-20 keV. The monochromator directs the X-rays onto the sample chamber, which is designed for convenient sample mounting. The sample chamber is outfitted with a focusing attachment for high-resolution experiments and a finite-geometry sample holder for single-crystal measurements. It also includes an automated sample loading and alignment tool. The detector of RIGAKU MFM 65 is a multi-element array of crystalline X-ray scintillators. It features a large acceptance angle with a wide viewing angle of up to 160°. The asset is capable of measuring the X-ray intensities, linewidths, lattice parameters and crystal information in a single measurement. MFM65 is also equipped with a data acquisition model for recording and analyzing the X-ray diffraction data. MFM 65 provides high-resolution, high-efficiency X-ray diffraction data. The adjustable-geometry X-ray source and multi-element scintillator detector allow for measurement of the X-ray intensities over a wide range of angles. The sample chamber is designed for easy sample mounting and has an automated sample loading and alignment equipment. RIGAKU MFM65 is and ideal choice for high-resolution X-ray diffraction measurements of a variety of materials, from thin films and single crystals to powders and interfaces.