Used RIGAKU MicroMax-007 #293670677 for sale

RIGAKU MicroMax-007 is an advanced X-ray equipment for scientific and industrial applications. This system is ideally suited for precise single crystal X-Ray diffraction analysis, and offers a wide range of capabilities. The unit consists of a powerful X-Ray source, optical components, detector, and a console for user control. The X-ray source of the machine is powered by a 30 kW X-ray generator, providing stable and uniform spot illumination of samples. This generator is composed of an X-ray tube, an electronic control tool, and a high-frequency power supply to generate the required X-ray energy. The source also includes an advanced cooling asset to manage the cooling of the X-ray tube head. An optical model composed of mirrors and lenses are used to project the X-ray beam onto the sample, while providing magnification and focusing. The mirrors are specially designed so that they can withstand the high temperature of the X-ray beam and enable precise manipulation of the beam shape. The lens used in the equipment is a large CCD device providing good resolution and sensitivity. A detector is used to detect the X-rays emitted from the sample. The detector system consists of a multi-channel plate (MCP) and a cooled CCD camera. The MCP provides efficient conversion of X-ray photons to electrical signals, while the cooled CCD camera provides high resolution digital images of the sample. The user control is managed through a console. This allows the user to adjust parameters such as exposure time and intensity of the X-ray beam. The console further provides an interface to review the acquired data and create reports on the sample's properties. MicroMax-007 offers unparalleled performance in X-ray diffraction applications and is well suited for a variety of industrial and scientific applications. The unit is ideal for precision measurements and offers high resolution imaging and analysis capabilities. The advanced optics, generator, detector, and user control provide unparalleled performance in X-ray diffraction analysis.