Used RIGAKU Miniflex #9158241 for sale

RIGAKU Miniflex is an X-ray diffraction equipment designed for rapid qualitative and semi-quantitative analysis of crystalline or amorphous materials. This system is particularly suitable for particle size and shape analysis, as well as searching for unknown structure, phase identification, and quantitative phase analysis. The unit is equipped with a high-performance, high-brightness X-ray light source and an X-ray multi-line filter wheel to provide the shortest diffraction time and maximum data collection precision. The machine features a state-of-the-art, highly sensitive X-ray detector to accurately measure data over a wide range of X-ray diffraction angles. This detector is based on a 1024-pixel semiconductor diode array and working angle range of 2-100°. With a compact size and no moving parts, this tool drastically reduces maintenance requirements. The proprietary Miniflex software provides for quick and easy operation. It can easily identify the phases present in a sample, quickly determine the phase distribution, and enable the analysis of crystal structure information. This software also processes XRD data to measure crystallite size and lattice strain. It can also correlate XRD data with optical images and generate 3D interactive models. The asset is housed in a single, rugged chassis that can be set up in a lab or a production line, and provides for easy portability. A built-in PC is included for total model control. This PC also includes a user interface that allows for custom configurations and the execution of customer-defined measurement programs. Overall, RIGAKU Miniflex X-ray diffraction equipment provides powerful and precise capabilities for analyzing a wide variety of materials in research and production environments. Its user-friendly interface and built-in PC ensure fast setup and effortless operation. This system offers excellent performance for a wide range of applications in various industries, making it an ideal choice for quick and accurate analysis of crystal structure and phase identification.