Used RIGAKU R-AXIS IV++ #9184694 for sale
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ID: 9184694
Image plate detector
2D X-Ray detector system
Reader section:
Reader device
Sample axis (Φ-axis: standard, K-goniometer: option)
Camera length adjustment section
Optics section:
Graphite monochromator optics
Mirror-mirror optics
Multilayer-film mirror
Reader section:
White IP size: 300 x 300 mm
(2) Blue IP size: 200 x 200 mm
Readable pixel size:
White IP: 100 μm x 100 μm or 200 μm x 200 μm
(2) Blue IP: 50 μm x 50 μm
Reading time:
100 seconds when the 100 μm x 100 μm size is used
50 seconds when the 200 μm x 200 μm size is used
180 seconds when the 50 μm x 50 μm size is used
Laser light source: Semiconductor laser (maximum rating: 35 mW)
Detector: Photomultiplier tube
Dynamic range: 1 to 1.04 x 106 ADU
Reading sensitivity: (2) counts/X-ray photon
Background:
Sigma value: 1.0 photon/pixel or smaller
Erasure time: 20 seconds
Controller section:
Data conversion: ADC/20-bit
Data transfer: PIO System
Control: RS-232C
HV: -600 V
ϕ-Axis stage section:
Goniometer steps: 0.002°
Maximum speed: 720°/min
Manual rotation: 360° free rotation
Height adjustment range: ±15 mm
Beam stopper: Automatic escape mechanism incorporated
Camera length adjustment range: 70 to 300 mm
Camera length indicator: Digital (Minimum digits: 0.1mm)
Telescope: Erect image, 40X ( collapsible)
Goniometer head used: IUCr 49 mm type (64 rnm type usable)
Reader section:
Reader main body set
Vacuum pump (with a connection tube)
Connection cables
Reader/Φ axis stage connection cable
Reader/controller connection cable
Controller section:
Controller set
Connection cables:
Controller/reader connection cable
Controller/CPU connection cable
Controller/X-ray generator connection cable
(2) Enclosure color types: Black and blue.
RIGAKU R-AXIS IV+++ is a state-of-the-art X-ray equipment designed for the qualitative and quantitative analysis of non-crystalline and crystalline materials. This system allows for the rapid and accurate determination of elemental and phase composition of material in a wide range of sample architectures. R-AXIS IV+++ includes an X-ray generator loaded with an X-ray tube with 4 kW power capacity, and a specially designed 2D/3D sample holder for sample positioning. The 2D sample holder is capable of carrying samples up to 500 mm in diameter, while the 3D sample holder allows for the accommodating of irregularly shaped samples of > 500 kg in size. The unit is also fitted with a high-speed goniometer head to rotate samples in the X-ray beam for precise measurement of all X-ray diffraction (XRD) angles. The sample holder is coupled to a 600 mm long analyser crystal clear design which is placeable over the sample and configured to be coplanar with the X-ray beam, allowing for optimal performance of the XRD machine. RIGAKU R-AXIS IV+++ features a high-resolution detector, with a 17,000-element linear position-sensitive detector employing a 512 x 1024 pixel detector array and a magnifier constructed on a 5-axis manipulator. This allows for the collecting of high-resolution 2D XRD data from levels between 10-10000 counts/s, allowing for the fast and accurate determination of material composition and structure. The tool is further equipped with a computer interface to allow for the real-time acquisition and display of XRD data and the comparison of results against a standard spectrum library. R-AXIS IV+++ supports the analysis of a wide range of materials, such as powdered, pelletized, oil-embedded, and in-situ samples, for use in various applications such as thin film analysis, micro-XRD analysis, structural analysis, and chemical analysis. The asset is also very flexible, allowing for the customization of sample preparation, measuring, controlling, and data analysis processes. Overall, RIGAKU R-AXIS IV+++ is a powerful and advanced X-ray model that provides users with a range of capabilities to perform advanced X-ray and material analysis. It is highly versatile, robust, and provides users with excellent results in several different applications.
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