Used RIGAKU TG 8120 #9078492 for sale

RIGAKU TG 8120 Extreme X-ray Diffractometer (XRD) is a high performance, high-resolution, high-precision X-ray diffraction equipment. The system is designed for a wide range of applications, including material science, semiconductors, catalysis, and pharmaceuticals. It uses a focused X-ray beam to measure the diffraction of X-rays off crystals and samples. This information can then be used to measure physical properties such as size, strain, composition, lattice parameters, in addition to other information important for materials research and development. TG 8120 XRD unit includes several components, including an X-ray source, sample holder, sample holders, a detector machine, and sample cooling. The X-ray source is a rotating anode X-ray generator, designed for maximum X-ray homogeneity. The tool is equipped with an automated sample changer, enabling measurements to be quickly changed between samples. The sample holder is powered by an electromagnetic actuator, allowing for precise positioning of the sample relative to the X-ray source. The sample holders in the asset feature temperature control capabilities, allowing for controlled adjustable of sample temperature. The detector model employed in RIGAKU TG 8120 XRD includes a high-precision, high-speed CMOS image detector for detecting the X-ray diffraction patterns. The detector is combined with a high-resolution digital oscilloscope, providing excellent signal stability and accuracy. The detector is capable of measuring both amplitude and phase of diffracted X-rays. The detector equipment also includes an integrated CCD camera, allowing for digital imaging of X-ray diffraction patterns. The sample cooling system in TG 8120 XRD helps protect samples from too much heat exposure during the measurement. It works by circulating a coolant in a closed coolant loop, providing efficient cooling. The sample coolant unit is programmable and can be used to cool any sample to temperatures from -20 °C to +100°C. RIGAKU TG 8120 XRD is a versatile machine that can be used for a wide variety of experiments, such as analyzing materials and nanostructured materials, studying material porosity and density, measuring crystallinity, determining crystal structure parameters, material imaging and strain measurement, phase identification and analysis, and more. This XRD tool is extremely precise, allowing for measurements with a resolution of 0.5 arcseconds in 2θ x-ray diffraction. The asset is also capable of accurately measuring samples that have rotational misalignments of up to 15 degrees.