Used RIGAKU Ultima IV #293731338 for sale

RIGAKU Ultima IV is an advanced X-ray diffractometer designed for the analysis of samples in a wide variety of areas including chemistry, biology, life sciences, materials science, and engineering. Ultima IV uses a highly sensitive detector and proprietary software to accurately detect, analyze, and quantify any X-ray diffraction data it receives. This advanced system is equipped with many features that provide a multitude of options for samples of many types. RIGAKU Ultima IV is a multi-axis system capable of capturing X-rays from different angles for a more accurate and in-depth analysis. It is designed to be adaptable with the ability to switch between assemblies as different samples require different setups. This makes it a staple for any laboratory needing X-ray diffraction data for their research. Ultima IV features a small and lightweight X-ray source, allowing it to be used in many different environments and applications. This small design increases the portability and versatility of the system, making it ideal for in-field applications. The X-ray source can be set to different energies and angles, allowing the user to select the most suitable configuration for any sample. RIGAKU Ultima IV is equipped with high-precision sample stages, which are designed to be low-tension and vibration-resistant. This ensures accuracy and repeatability by providing an optimized environment for capturing X-ray diffraction data. Additionally, the stages are encased in a temperature-controlled chamber that can maintain the sample temperature during the analysis. RIGAKU proprietary software is also included in Ultima IV. This software enables the user to capture and analyze large amounts of diffractometry data quickly and accurately. Additionally, it gives users the power to detect subtle changes in sample properties and quickly determine the sample's crystals structure from the diffraction data captured. In summary, RIGAKU Ultima IV is an advanced and versatile X-ray diffractometer. Its multiple axes, small X-ray source, and temperature-controlled chambers provide users with a powerful tool for capturing and analyzing X-ray diffraction data quickly and accurately across many different fields.