Used SHIMADZU EDX-700HS #293779007 for sale
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ID: 293779007
X-Ray fluorescence spectrometer
X-Ray generator unit
X-Ray tube: Rh target
X-Ray filter
Cooling method: Air-cooled
X-Ray power supply unit:
Voltage: 5-50 kV
Metals: Cd, Pb, Hg, Br, Cr
Current: 1-1000 μA
Stability: ±0.01%
Detector:
Type: Si (Li)
Detection area: 10 mm²
Resolution: <150 eV
Counting unit:
Amplifier
Fitting time: 10 μs
Gain change: High / Low
Multi-Channel Analyzer (MCA)
Type: Sequential comparison ADC
(2048) Channels
Sample chamber:
Sample size: 300 mm
Measurement chamber:
X-Ray bottom irradiation area
Aperture diameter: 1, 3, 5, 10 mm
Measurement atmosphere: Atmospheric
CCD Digital observation system.
SHIMADZU EDX-700HS is a powerful, multi-purpose x-ray analysis equipment designed to provide comprehensive x-ray diffraction (XRD) and energy dispersive X-Ray Fluorescence (EDXRF) capabilities. This flexible system can analyze a wide range of materials including precious metals, alloys, minerals, polymers and thin films down to 2 angstroms. EDX-700HS comes equipped with a multi-angle X-ray diffractometer, an energy dispersive X-Ray Fluorescence (EDXRF) spectrometer and a high-speed x-ray source. The XRD analyze samples by producing a narrow beam of monochromatic X-rays that interact with the sample's crystalline structure, producing an X-ray diffraction or XRD pattern. The unique feature of SHIMADZU EDX-700HS is its combination of the powerful yet simple-to-use EDXRF spectrometer and the versatile XRD capabilities. XRD and EDXRF can be used together to identify the structure and composition of samples with accuracy and reliability. EDX-700HS's XRD unit consists of an X-axis projection optical machine and two CO2 lasers, capable of producing X-radiation from 5 to 40 degrees angle of scanning. This allows for efficient data collection, in less time than traditional diffraction methods. SHIMADZU EDX-700HS has an adjustable beam path with a large aperture for versatile sample positioning, and a built-in scan generator for rapid sample experiments. It also features variable slit and temperature compensation capabilities for accurate data analysis. EDX-700HS uses an energy dispersive X-Ray Fluorescence (EDXRF) spectrometer to rapidly capture data on the composition of samples. The EDXRF spectrometer is equipped with a Scintillation Detector and a Proportional Counter to detect the fluorescence of elements in the sample. This EDXRF spectrometer can detect elements from detectable to trace amounts, with high accuracy and precision over a wide range of energies. Overall, SHIMADZU EDX-700HS is a powerful and versatile X-ray analysis tool that combines XRD and EDXRF capabilities in one simple to use tool. With its advanced hardware and user-friendly software, EDX-700HS provides efficient, reliable and accurate data collection. It is ideal for applications in various industries including metal, minerals, plastics and polymers, and thin film analysis.
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