Used SIEMENS / BRUKER D8 Discover #293757948 for sale

SIEMENS / BRUKER D8 Discover is a high-resolution x-ray diffractometer designed to analyze the crystalline structure of solid materials. It provides accurate and reliable data regarding material crystallinity for many materials such as polymers, metals and semiconductors. BRUKER D8 Discover utilizes a rotating anode tube and vertical sample stage to apply x-ray radiation of a specific wavelength to the sample material. When the x-ray beam is diffracted through the material, the angles and magnitudes of the diffracted beams are measured. This data is then used to calculate the sample's diffraction pattern which shows the location, intensity and width of the peaks in the diffraction pattern, known as its diffractogram. This diffractogram is then used to map out the crystallinity of the sample and estimate its degree of crystallinity. SIEMENS D8 Discover offers fast and reliable analysis of sample materials thanks to its high speed measurement and data acquisition capabilities. The equipment features an advanced optics system which allows it to measure samples with much greater resolution than earlier diffractometers. In addition, the advanced optics unit is coupled with an improved detector machine which increases the dynamic range of the tool and improves its accuracy. Other features of the asset include automatic sample changers and user-friendly software which allows scientists to generate accurate diffractograms with just a few clicks. D8 Discover provides researchers with the tools they need to obtain reliable data about a sample's crystallinity quickly and accurately. This allows them to make more informed decisions about the properties and applications of their materials. In addition, the high speed and accuracy of the model make it ideal for research in materials science and other fields which require accurate data about material crystallinity.