Used VEECO GXR-300 #9203414 for sale

VEECO GXR-300 X-Ray Equipment is a high-tech, reliable 3-D imaging solution for material science analysis and electrical measurements. Featuring an advanced 300kV x-ray source, the system helps to provide accurate and detailed images of microelectronic structures and materials to determine their properties such as density, composition, and others. The unit boosts operator productivities by providing rapid, rapid three-dimensional imaging capability and utilizing an intuitive graphical user interface. It offers flexibility with a wide range of x-ray sources, detectors, and other components to allow users to configure the machine to fit their unique application demands. GXR-300 also offers a variety of analytical tools, such as automated defect and measurement tools, 3-D navigation tools, robust line-scan interpolation, multiple functions for integration into automated handling systems, and software for data-management and manipulation of 3-D volumes. This allows researchers to study the materials accurately by providing excellent x-ray images in direct correlation with the traditional (macroscopic) EDX analysis. Various inspection methods can be performed on VEECO GXR-300 ranging from mapping of electrical characteristics on wafers, to 3D X-ray imaging of semiconductor features for measurement and comparison purposes. GXR-300 is ideal for high-end, large-area C-SEM imaging to determine process-induced defects on wafers, and to measure various features such as die size and pitch. It also allows scanning of sample in various directions to image features and material properties in three-dimensions with a single scan, making this tool a great enhancer for research and development of new materials. In addition, sample can be analyzed without mounts or sample holders, as the holding asset can support nonstandard applications such as packages, sheet materials, and solar cells. VEECO GXR-300 is anchored by VEECO advanced BeamPath technology featuring ultra-precision x-ray alignment, long-term stability and drift, and beam protection techniques to provide high-resolution images consistently and reduce image variation due to environmental conditions. This model makes it an efficient and reliable device for researchers and material scientists who need a powerful tool to investigate their materials without sacrificing accuracy or ease-of-use. It is a value-driven equipment designed to increase throughput, reduce labor costs, and maximize productivity.