Used TDK AFM 15 #9208727 for sale

TDK AFM 15 is an automated force microscope (AFM) developed by TDK Corporation for scanning surface microstructures. It is based on the latest in AFM technology and has a range of features that make it a perfect instrument for researching and measuring surface microstructures. TDK AFM-15 is a three-axis scanning device, consisting of an optical equipment, a mechanical stage and a probe assembly. The optical system provides visualization, allowing for high-resolution imaging of remarkable resolution. The mechanical stage enables precision positioning, while the probe assembly provides a wide range of scanning possibilities. The probes have a diameter of just 10 nanometers, allowing for detailed scanning of fine surface microstructures. AFM 15 provides a number of modes for scanning surfaces. These include tapping mode, contact mode, dynamic force spectroscopy, and cantilever tracking. Each mode is designed to measure different properties of the surface microstructure. For example, in tapping mode, the tip of the probe is oscillated at an amplitude of between 2 and 10 nanometers, enabling the scanning of excellent images of the surface in nanometer-scale resolution. Using AFM-15 also allows for various data acquisition methods and image processing. For this purpose, several different software packages are integrated into the unit, such as AutoScan software, TLMAP software, and TrueHeight software. These packages provide a wide range of features, including various models and measurements, as well as different parameters and functions for calibrating the machine. TDK AFM 15 is therefore a versatile and user-friendly instrument for measuring delicate surface micromechanical properties. With its highly sensitive probes, advanced software packages, and imaging capabilities, TDK AFM-15 is reliable and extremely accurate. It is the perfect choice for researchers interested in investigating microscopic details of any surface structure.