Used ADVANTEST BEM-037093 #9236477 for sale

ADVANTEST BEM-037093
Manufacturer
ADVANTEST
Model
BEM-037093
ID: 9236477
HSIF Cal board for T 6373(ND3).
ADVANTEST BEM-037093 is a final test equipment designed with increased testing throughput and cost-effectiveness in mind. It is a versatile modular system which is able to be used for a wide variety of semiconductor products including minboards, digital and analog, and RF. This allows customers to quickly and easily configure the test unit to their product making it one of the most efficient test systems available. BEM-037093 includes many powerful features, such as auto-placement, performance optimization, test parametric optimization, dynamic optical image recognition, and real-time test data analysis. All of these features help ensure efficient and reliable testing. Additionally, the user-friendly interface makes it easy for operators to handle the test machine quickly and easily. The tool is built using high-performance PCs with Windows Embedded operating asset. The mainframe PC is coupled with several subsystems, such as the model controller, interface board, and test head. The multifunctional test head ensures that tests can be performed on substrates of different sizes and supports a variety of automated test functions. The test head also comes with a built-in software that can detect optimization paths and improve test performance. ADVANTEST BEM-037093 also comes with an advanced test management equipment that allows users to monitor, control, and analyze tests from a central report. This makes it easy for customers to optimize the test process and quickly identify any potential issues. The system provides exceptional data resolution and speeds up test reporting by using a powerful and secure internal database engine. Overall, BEM-037093 provides a versatile and cost-effective solution for final test systems. It is exceptionally well-suited for a wide variety of products, and its user-friendly interface and powerful test management unit make it easier to optimize tests and quickly identify any potential issues.
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