Used ADVANTEST BGR-026240 #9105558 for sale

ADVANTEST BGR-026240 is a Final Test Equipment from ADVANTEST Corporation designed for use in a wide range of semiconductor applications. This system utilizes high-speed pin-drivers to enable a rapid test cycle which reduces cost and time in the backend testing of semiconductor devices. The unit includes a controller and up to two test modules to allow for flexible configuration options and test strategies. The controller provides communication between the test modules, the test handlers, the embedded software application, and the test site's datacenter, allowing for powerful data analytics. This machine can handle different sizes of substrates, ranging from the larger PCBs up to wafer-level devices. The test module features a multi-site measurement capability, providing a high input/output testing throughput. Each test module contains 16 independent pins, with each pin capable of 8 bits. This tool is compatible with both parallel and serial scan patterns for input and output testing, allowing for the use of numerous test algorithms. Additionally, a high-speed test head is included to fully enable boundary scan, high-frequency, parametric, and functional tests. The powerful embedded software application for the asset provides immense flexibility in test programming. It has comprehensive test sequencing and programming capabilities, as well as extensive debug analysis tools. The software can also be extended to include additional customization as needed by the customer. In order to increase the effectiveness of the on-site test process, BGR-026240 is also equipped with anti-gaussian noise filters and a slew rate control feature, allowing the test engineer to quickly and accurately respond to issues that arise during testing. Additionally, a comprehensive barcode recognition model is included, which allows the equipment to quickly and accurately scan the barcode on each substrate to begin testing. Overall, ADVANTEST BGR-026240 is a powerful Final Test System that provides high testing accuracy, speed, and flexibility. Its comprehensive controller, test module, and software features enable it to handle a wide range of semiconductor tests with ease.