Used ADVANTEST T 2000 #9165412 for sale
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ID: 9165412
Vintage: 2013
Tester
Configuration:
Board Module
(8) DPS 500mA
(22) 800Mbps DM
(2) LCDPS
(2) BBWGD
(4) PMU32
(2) AAWGD
(1) RC5V
Module information:
[MODULE] [SLOT] [BUS] [CHANNEL]
LCDPS 5 5 1 - 8
LCDPS 48 28 9 - 16
AnalogSync 26 17 EXIST
DPS500mA 6 6 1 - 32
DPS500mA 32 12 33 - 64
DPS500mA 33 13 65 - 96
DPS500mA 20 23 97 - 128
DPS500mA 9 35 129 - 160
DPS500mA 19 49 161 - 192
DPS500mA 46 55 193 - 224
DPS500mA 43 58 225 - 256
SyncGen36 1 1 EXIST
JMM 52 24 1 - 8
BBWGD 35 41 1 - 32
BBWGD 17 51 33 - 64
DM800MBPS 2 2 1 - 128
DM800MBPS 3 3 129 - 256
DM800MBPS 4 4 257 - 384
DM800MBPS 28 8 385 - 512
DM800MBPS 29 9 513 - 640
DM800MBPS 30 10 641 - 768
DM800MBPS 31 11 769 - 896
DM800MBPS 25 18 897 - 1024
DM800MBPS 24 19 1025 - 1152
DM800MBPS 23 20 1153 - 1280
DM800MBPS 22 21 1281 - 1408
DM800MBPS 51 25 1409 - 1536
DM800MBPS 50 26 1537 - 1664
DM800MBPS 49 27 1665 - 1792
DM800MBPS 12 38 1793 - 1920
DM800MBPS 13 39 1921 - 2048
DM800MBPS 38 44 2049 - 2176
DM800MBPS 39 45 2177 - 2304
DM800MBPS 15 53 2305 - 2432
DM800MBPS 14 54 2433 - 2560
DM800MBPS 41 60 2561 - 2688
DM800MBPS 40 61 2689 - 2816
AAWGD 36 42 1 - 32
AAWGD 16 52 33 - 64
PMU32 7 33 1 - 32
PMU32 10 36 33 - 64
PMU32 45 56 65 - 96
PMU32 42 59 97 - 128
SyncMtx36 56 - EXIST
SyncMtx36 54 - EXIST
2013 vintage.
ADVANTEST T 2000 is a Final Test equipment used to perform final tests on integrated circuits (IC) and System on Chips (SOC). It is a modular platform that uses the latest in testing technology and test services to ensure high quality testing. The unit is designed to meet the needs of both large and small scale IC and SOC manufacturers and test houses. ADVANTEST T2000 offers a wide range of features to help maximize quality while maintaining fast throughput and cost-efficiency. It features a high-speed machine bus and test architecture that enable multi-site testing, high throughput rates and reliability. The tool has a high-speed analog measurement module, a high-density probe card and can be configured for multiple DUT's. The asset controls a wide range of test strategies, which include testing parametric characteristics, power leads and bond wires, and insulation tests. It also has built-in support for various test algorithms and test structures, resulting in better accuracy and comprehensiveness of tests. This provides a higher level of production quality. The model also offers advanced defect inspection capabilities. Its optical defect detector can quickly identify weak-signal switches and incorrect operations of DUTs. The equipment also offers an in-line metrology for comprehensive testing, which can detect even small-scale defects. T 2000 is optimized for flexibility, enabling the simultaneous testing of multiple product categories. It is also capable of Automatic Test Program Generation (ATPG), which minimizes the effort required in programming and maintaining test programs. The system also features a Test Flexibility Architecture (TFA). This architecture is based on a Virtualization Overlay that allows the unit to dynamically adapt to changes in logic, package, test requirements and test methods. The overlay also allows for data link interface testing and synthesis. Finally, the machine integrates easily with test lab automation, allowing for global test and tool monitoring. This makes it easy to measure, analyze, and compare test results from different locations quickly, and to manage reports and generated data. To summarize, T2000 Final Test Asset is a comprehensive and flexible model that provides IC and SOC manufacturers with a wide range of test services and capabilities. It offers high throughput rates, reliability and accuracy, as well as advanced defect inspection capabilities. Additionally, its Test Flexibility Architecture makes it easy to adapt to changing logic and test requirements, and it integrates easily with test lab automation systems.
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