Used ADVANTEST T 3326A #293670442 for sale

ADVANTEST T 3326A
Manufacturer
ADVANTEST
Model
T 3326A
ID: 293670442
Tester.
ADVANTEST T 3326A is a Final Test Equipment designed for production test purposes. It is an ideal solution for fully automated production test of IC devices and has been proven to increase yields in production lines. T 3326A offers a compact design with high speed test times and boasts advanced system features that provide a fast, reliable, and cost-effective solution for automated final IC test. ADVANTEST T 3326A utilizes a number of advanced features to achieve its superior performance. It offers high-speed digital communication, which improves test times significantly compared to conventional analog test systems. Its latest PXI-based platform ensures optimal testing including high performance digital, mixed signal, and isolated channel tests. This out of the box unit requires no complicated additional setups and can be integrated easily into existing test operations. T 3326A supports a wide variety of test types, providing both general-purpose testing as well as specific IC device types. IC device types supported include memory, logic, processor and CPU devices. ADVANTEST T 3326A supports a wide variety of test commands such as IDT, MMT, DDR, SDRAM, SMD, ISD, PMC, & RP devices. Also available is a range of high-end diagnostics and real-time monitoring capabilities, enabling users to monitor functional performance and accurately detect anomalies during testing process. T 3326A prioritizes safety, and features advanced safety functions. These functions include man-machine dialogue for function setting, block-cutting, alarm monitoring, and ESD protection. ADVANTEST T 3326A is also equipped with an automated fail-safe machine designed to quickly notify operators of any test irregularities. T 3326A Final Test Tool is an ideal choice for companies looking to increase their production yields. Its advanced features, coupled with its fast test speeds, safety functions, and easy integration, make it an excellent choice for quickly and reliably testing IC devices.
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