Used ADVANTEST T 3347 #293610015 for sale
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ID: 293610015
Tester
Processor: TP4A
(2) Test heads
SYSTEM CONFIGURATION GENERATE
Configuration of test station
How many test station <1 or 2 & CR> ? 2 ................> 2
Test station 1 is 256HV2
Station1 reverse flow type <Y or N & CR> ? yes .............> yes
What number of pin exist in station 1 ......................> 1-256
pin no. (ex:1-256) ? ..................> 1-256
Test station 2 is 256HV2
Station2 reverse flow type <Y or N & CR> ? yes .............> yes
What number of pin exist in station 2 ......................> 1-256
pin no. (ex:1-256) ? ..................> 1-256
SELECT PPS/MDC/UDC
System : 4PPS (1) or 8PPS (2)
Select PPS (see above) <0-2 & CR> ? 2 ............> 2
Station 1 : 8MDCs (1) or 16MDCs (2) or 24MDCs (3) or 32MDCs (4)
Select MDC (see above) <1-4 & CR> ? 2 ............> 2
Station 1 : 1UDC (1) or 2UDCs (2) or 4UDCs (4)
Select UDC (see above) <0-4 & CR> ? 2 ............> 2
Station 2 : 8MDCs (1) or 16MDCs (2) or 24MDCs (3) or 32MDCs (4)
Select MDC (see above) <1-4 & CR> ? 2 ............> 2
Station 2 : 1UDC (1) or 2UDCs (2) or 4UDCs (4)
Select UDC (see above) <0-4 & CR> ? 2 ............> 2
60V PPS/UDC option exist <Y OR N & CR> ? no ........> no
BIT/AD option exist <Y or N & CR> ? no .........................> no
ADC test option exit <Y or N & CR > ? no .......................> no
Select option CLK
64TE CLK option exist <Y or N & CR> ? no .....................> no
Select STE size
STE capacity 256KW(1) 1MW(2)
Select STE size (see above) <1-2 & CR> ? 2 ...................> 2
SBM option exist <Y or N & CR> ? yes ..........................> yes
How many SBM memory boards <1-2 & CR> ? 1 ...................> 1
ALPG option exist <Y or N & CR> ? no ...........................> no
END SAVE.
ADVANTEST T 3347 is a Final Test equipment for production testing on integrated circuit chips. The system provides throughput of up to 100,000 chips per hour and offers advanced test coverage, hardware, and software features. The unit is built on a modular platform and is composed of a PXI/cPCI card cage, internal power supply, cooling machine, backplane and CPU. This core architecture holds multiple modules, including a hot-swappable high speed programmable logic controller (PLC), measurement instrument, waveform generator, and a customizable library of libraries that support a wide variety of third-party applications. Additionally, the tool utilizes high precision analog tester units and differential sampling probes to measure dual port attributes. ADVANTEST T3347 boasts a 20-bit vertical resolution and 6 & 8 bit horizontal resolution and is capable of 100MHz scan chaining. It is a compact asset, utilizing a wide range of advanced Test and Testability (TT) architectures and Test Development tools. Memories, microprocessors, and digital circuits can be tested using T 3347. In addition, parameterized testing allows the user to limit the time required for test development and debug, while maintaining high test coverage. T3347 offers an extensive list of programming and user-interfacing features such as auto-execution of tests, test result analysis and diagnostic tools, Verification and Manager, TestPort graphing and database features, coupled with a suite of statistical analysis and reporting capabilities. The customizable test programs and test libraries enable users to refine the process of testing complex and highly sensitive integrated circuits and to further optimize the test cycle time. The model's hardware and software components are hardware upgradeable thus extending the life of the equipment and reducing total cost of ownership. ADVANTEST T 3347 provides a test solution that meets today's manufacturing guidelines while meeting the highest standards of safety and quality. This system is designed to process a high number of integrated circuits in a convenient and automated way, resulting in maximum efficiency and output.
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