Used ADVANTEST T 3347B #9103859 for sale

ADVANTEST T 3347B
Manufacturer
ADVANTEST
Model
T 3347B
ID: 9103859
Vintage: 1996
IC testers 1996 vintage.
ADVANTEST T 3347B Test Equipment is an advanced multi-site test system for testing complex microelectronic devices. It is specifically designed to perform final test and characterization of high density PC board assembled printed circuit boards with up to 32 parallel digital or analog test channels. The unit's 32-channel parallel configuration allows high throughput production testing. With the combination of multiple devices and advanced test multi-site capabilities, T 3347B can simplify final testing requirements which can significantly reduce test time and costs. The machine features a built-in data manager which quickly stores product test data and provides real-time or batch measurements for data retrieval. The built-in USB2.0 ports enable direct connection to external devices such as PCs, printers, barcode readers, and other peripherals. A VGA monitor is integrated for test configuration and graphical output. ADVANTEST T 3347B is a full-featured test tool, including semiconductor device stress, burn-in board testing and evaluation, as well as 2D, 3D, thermal imaging, and X-Ray inspection. The asset also includes fast, reliable automatic device-under-test (DUT) handling, insertion test, and vision recognition capabilities. The model's modular design allows users to choose necessary components that meet their applications requirements. Each station can be controlled independently with distributed test environment (DTEN) allowing simultaneous testing of multiple products and process optimization. The equipment's comprehensive software suite offers user-friendly programmable operation, traceability, and self-diagnostic functions through the combination of GUI-based interface and integrated test programs. The software enables easy implementation of device programming and initialization steps, multi-channel test patterns, and fault indication, analysis and classification. Additionally, scan testing capabilities provide extensive coverage for digital logic devices. Optionally, the system can be configured with an adjustable height test head for manual DUT removal and insertion. In conclusion, T 3347B Test Unit is a high-performance, multi-site test machine that simplifies final test and characterizing requirements. With the combination of its modulare design, user friendly programmable operations, and self-diagnostic functions, the tool offers an efficient testing solution.
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