Used ADVANTEST T 5334 #9165753 for sale
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ID: 9165753
Tester
Test frequency: 50MHz
Driver / IO Channels: 650 Channels per station
DC Channel : 8 Channels per station
Pattern memory capacity: 144M
CPU Type: SPARC
Options:
Flash installed
MRA Not installed
(2) Stations
Engineering workstation (EWS): SUN SPARC Series
DIAG/R
BOARDNAME/REVISION PROCESSING PROGRAM
0.UPDATE DATA FILE & RETURN
1.RETURN TO SYSTEM
2.LIST UP BOARDNAME/REVISION
3.CHANGE BOARDNAME/REVISION
4.OUTPUT DEVICE SELECT DEV=1
SELECT <0-4> ................................> 2
LIST UP BOARDNAME/REVISION
UNIT NAME : TPMRA MRA3 DPU FTU VIO TH1 THC1 TH2 THC2 UIF (ALL)
SELECT .....> ALL
SYSTEM CONFIGURATION LIST
SYSTEM IDENTIFICATION SPN06
CONFIGURATION OF TEST HEAD
NUMBER OF TEST HEAD [1,2] ...........................> 2
CONFIGURATION OF TEST HEAD 1
TEST HEAD TYPE 1.650CH
2.1300CH [1,2] .....................> 1
PIN CONFIGURATION SLOT NO. [33,97,41,105]
CHILD A ....> 33,41,97,105
CHILD B ....> 33,41,97,105
CHILD C ....> 33,41,97,105
CHILD D ....> 33,41,97,105
PIN CONFIGURATION OPTION1 PIN CARD [Y,N]
CHILD A ....> NO
CHILD B ....> NO
CHILD C ....> NO
CHILD D ....> NO
PIN CONFIGURATION OPTION2 PIN CARD [Y,N]
CHILD AB ...> NO
CHILD CD ...> NO
BYPASS CAPACITOR TO 10V/16V PPS (PCON)
1.NON-EXISTENT
2. EXISTENT [1,2] ..............> 1
BYPASS CAPACITOR TO HV PPS (PCON)
1.NON-EXISTENT
2. EXISTENT [1,2] ..............> 1
CONFIGURATION OF TEST HEAD 2
TEST HEAD TYPE 1.650CH
2.1300CH [1,2] .....................> 1
PIN CONFIGURATION SLOT NO. [33,97,41,105]
CHILD A ....> 33,41,97,105
CHILD B ....> 33,41,97,105
CHILD C ....> 33,41,97,105
CHILD D ....> 33,41,97,105
PIN CONFIGURATION OPTION1 PIN CARD [Y,N]
CHILD A ....> NO
CHILD B ....> NO
CHILD C ....> NO
CHILD D ....> NO
PIN CONFIGURATION OPTION2 PIN CARD [Y,N]
CHILD AB ...> NO
CHILD CD ...> NO
BYPASS CAPACITOR TO 10V/16V PPS (PCON)
1.NON-EXISTENT
2. EXISTENT [1,2] ..............> 1
BYPASS CAPACITOR TO HV PPS (PCON)
1.NON-EXISTENT
2. EXISTENT [1,2] ..............> 1
CONFIGURATION OF DPU
1'ST DPU : STN 1,2 [Y,N] ..........................> YES
2'ND DPU : STN 1,2 [Y,N] ..........................> NO
TEST HEAD 1 DC CONFIGURATION [1-16] .............> 1-8
10V PPS CONFIGURATION [1-32] .............> 1-8
16V PPS CONFIGURATION [17-32] ............> 17-32
HV PPS CONFIGURATION [1-4] .............>
TEST HEAD 2 DC CONFIGURATION [1-16] .............> 1-8
10V PPS CONFIGURATION [1-32] .............> 1-8
16V PPS CONFIGURATION [17-32] ............> 17-32
HV PPS CONFIGURATION [1-4] .............>
1'ST GPIB I/F BOARD 0.NONE
1.BGR-010944X01
2.BGR-010944X02
3.BGR-010944X03
4.BGR-010944X04
5.BGK-012718 [0-5] .........> 0
2'ND GPIB I/F BOARD 0.NONE
1.BGR-016793 (DPU I/F)
2.BGR-010944X05
3.BGK-012718X02 [0-3] .........> 1
DMM TYPE 1.TR6861
2.R6871E
3.R6551
4.R6552T [1-4] .........> 3
AC FREQUENCY (HERTZ) [50,60] ........................> 50
CONFIGURATION OF FM
NUMBER OF FM BOARD [0-4] .........> 2
SIZE OF FM MODULE 1. 1M
2. 4M
3. 8M [1-3] .........> 1
NUMBER OF MEMORY BANK [1-2] .........> 1
NUMBER OF MEMORY BLOCK [1-4] .........> 4
PATTERN MEMORY [Y,N] .........> YES
SIZE OF PATTERN MEMORY BOARD 1. 36M
2. 144M
3. 288M [1-3] ...> 2
FM BOARD KIND 1. BGR-020816
2. BGR-020816X02 [1-2] ..............> 1
CONFIGURATION OF MRA
MRA2/3 OPTION [Y,N] ...........................> NO
CONFIGURATION OF FCDC
FLASH OPTION [Y,N] ...........................> YES
SC BOARD KIND 1. BGR-020774
2. BGR-020774X02 [1-2] ..............> 1
BOARDNAME LIST
1 WBL-0175758MB
2 BGR-017578
3 BGR-017579
4 BGR-018931
5 -
6 BGR-019266
7 BGR-019267
8 BGR-022461
9 BGR-022461
10 BGR-019267
11 BGR-022461
12 BGR-022461
BWB KH3-6530
UNIT NAME << MRA3 >>
SLOT BOARDNAME
1 BGR-019266X02
2 BGR-019267
3 BGR-022461
4 BGR-022461
5 BGR-019266X02
6 BGR-019267
7 BGR-022461
8 BGR-022461
9 BGR-019266X02
10 BGR-019267
11 BGR-022461
12 BGR-022461
13 BGR-019266X02
14 BGR-019267
15 BGR-022461
16 BGR-022461
BWB KH3-4488
UNIT NAME << DPU >>
SLOT BOARDNAME
1 BGR-016793
2 BGR-016794
3 BGR-016797
4 BGR-019486
5 BGR-019486
6 BGR-016797
7 BGR-019486
8 BGR-019486
9 BGR-016797
10 BGR-019486
11 BGR-019486
12 BGR-016797
13 BGR-019486
14 BGR-019486
15 BGR-021096
16 BGR-016796
17 BGR-016796
18 BGR-016796
19 BGR-016796
20 BGR-021096
21 BGR-016796
22 BGR-016796
23 BGR-016796
24 BGR-016796
25 BGR-020765
26 BGR-020765
27 BGR-017417
28 BGR-017418
29 BGR-017418
BWB KH3-1249
UNIT NAME << FTU >>
SLOT BOARDNAME
1 BGR-020853
2 BGR-020816
3 BGR-020816
4 BGR-020774
5 BGR-020816
6 BGR-020816
7 BGR-020774
8 BGR-020815
9 BGR-020814
10 BGR-020772
11 BMR-020812
12 BGR-020509
13 BGR-020773
14 BGR-020773
15 BGR-020773
16 BGR-020773
17 BGR-020771
18 BGR-018125
BWB KH3-4475
UNIT NAME << VIO >>
SLOT BOARDNAME
1 BGR-018824X03
2 BGR-018824X03
3 BGR-018824X03
4 BGR-018824X03
5 BGR-018822
6 BGR-018823X03
7 BGR-018823X03
8 BGR-018822
9 BGR-018824X03
10 BGR-018824X03
11 BGR-018824X03
12 BGR-018824X03
13 BGR-018822
14 BGR-018823X03
15 BGR-018823X03
16 BGR-018822
17 BGR-020851
BWB KH3-3162
UNIT NAME << TH1 >>
SLOT BOARDNAME
33A BGL-020768
97A BGL-020768
OP1A BGL-021040
41A BGL-020768
105A BGL-020768
O2AB BGL-021040
33B BGL-020768
97B BGL-020768
OP1B BGL-021040
41B BGL-020768
105B BGL-020768
33C BGL-020768
97C BGL-020768
OP1C BGL-021040
41C BGL-020768
105C BGL-020768
O2CD BGL-021040
33D BGL-020768
97D BGL-020768
OP1D BGL-021040
41D BGL-020768
105D BGL-020768
UNIT NAME << THC1 >>
SLOT BOARDNAME
A BGH-020852
C1 BGH-018826
C2 BGH-018827
CLMP BGH-018830
DC1A BGH-018829
DC1B BGH-018829
DC2A BGH-019207
DC2B BGH-019207
DC2C BGH-019207
DC2D BGH-019207
CLAB BGL-018831
CLCD BGL-018831
BWB KH3-0360
UNIT NAME << TH2 >>
SLOT BOARDNAME
33A BGL-020768
97A BGL-020768
OP1A BGL-021040
41A BGL-020768
105A BGL-020768
O2AB BGL-021040
33B BGL-020768
97B BGL-020768
OP1B BGL-021040
41B BGL-020768
105B BGL-020768
33C BGL-020768
97C BGL-020768
OP1C BGL-021040
41C BGL-020768
105C BGL-020768
O2CD BGL-021040
33D BGL-020768
97D BGL-020768
OP1D BGL-021040
41D BGL-020768
105D BGL-020768
UNIT NAME << THC2 >>
SLOT BOARDNAME
A BGH-020852
C1 BGH-018826
C2 BGH-018827
CLMP BGH-018830
DC1A BGH-018829
DC1B BGH-018829
DC2A BGH-019207
DC2B BGH-019207
DC2C BGH-019207
DC2D BGH-019207
CLAB BGL-018831
CLCD BGL-018831
BWB KH3-0360
UNIT NAME << UIF >>
SLOT BOARDNAME
1 BGK-011702
BWB KH3-6070
Type any key to exit[2J[1;1HBOARDNAME/REVISION PROCESSING PROGRAM
0.UPDATE DATA FILE & RETURN
1.RETURN TO SYSTEM
2.LIST UP BOARDNAME/REVISION
3.CHANGE BOARDNAME/REVISION
4.OUTPUT DEVICE SELECT DEV=1
SELECT <0-4> ................................> 0
END SAVE
/LOG OFF
DELTA DESIGN Deltaflex Handler
Specification:
Model: 1210
Max DUT testing: Max (8) DUT’S
Devices target: TSOP Type I, TSOP Type II, SOJ, SOP, CSP
Heating system: Chamber type
Temperature: -55 C to 160 C
Feed speed: 1200 units/hr.
ADVANTEST T 5334 is a Final Test system designed to maximize device performance and quality by providing high-speed, cost-effective testing of memory, logic, and mixed-signal devices. It offers high-precision digital vector testing, as well as full functional testing, using a combination of advanced algorithms and hardware optimization. T 5334 incorporates the latest in testing technology, using the most recent advances in digital signal processing, testing speed, and digital interfacing to ensure the highest degree of accuracy and performance. State-of-the-art analog and mixed-signal converters, available in a range of configurations, allow for the comprehensive characterization of complex devices in a wide variety of application areas. ADVANTEST T 5334 additionally includes features for dynamic monitoring of temperature, voltage, and current parameters, ensuring consistent and reliable operation even in fluctuating environmental conditions. By automatically monitoring signals in real time, the device can detect and react to potential risks before they become problems. T 5334 is designed to maximize throughput and flexibility in the testing process. Features such as automatic speed selection, dedicated digital vector sequences, and accelerated testing algorithms ensure that devices are quickly tested and inspected, with minimal operator intervention necessary. ADVANTEST T 5334 is equipped with a powerful test engine featuring advanced error detection and correction algorithms. These algorithms are tailored for different device types and provide the best results, regardless of the device's complexity or environment. Furthermore, the data collected during the test process can be used for comprehensive reporting and analysis, allowing manufacturers to monitor and improve their production processes. T 5334 system provides a high-end final test solution for applications where speed and accuracy are of the utmost importance. Its comprehensive feature set, advanced algorithms, and robust performance make it an ideal choice for any device manufacturer looking to verify product quality and ensure production quality standards.
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