Used ADVANTEST T 5335P #135567 for sale

Name: ADVANTEST T 5335P
Brand: ADVANTEST
SKU: 135567
Availability: InStock

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Final Test

Manufacturer

ADVANTEST

Model

T 5335P

ID: 135567

Vintage: 1997

Memory test systems Configuration: CONFIGURATION OF TEST HEAD NUMBER OF TEST HEAD [1,2] ...........................> 2 CONFIGURATION OF TEST HEAD 1 TEST HEAD TYPE 1.650CH 2.1300CH [1,2] .....................> 1 PIN CONFIGURATION SLOT NO. [33,97,41,105] CHILD A ....> 33,41,97,105 CHILD B ....> 33,41,97,105 CHILD C ....> 33,41,97,105 CHILD D ....> 33,41,97,105 PIN CONFIGURATION OPTION1 PIN CARD [Y,N] CHILD A ....> YES CHILD B ....> YES CHILD C ....> YES CHILD D ....> YES PIN CONFIGURATION OPTION2 PIN CARD [Y,N] CHILD AB ...> YES CHILD CD ...> YES BYPASS CAPACITOR TO 10V/16V PPS (PCON) 1.NON-EXISTENT 2. EXISTENT [1,2] ..............> 1 BYPASS CAPACITOR TO HV PPS (PCON) 1.NON-EXISTENT 2. EXISTENT [1,2] ..............> 1 CONFIGURATION OF TEST HEAD 2 TEST HEAD TYPE 1.650CH 2.1300CH [1,2] .....................> 1 PIN CONFIGURATION SLOT NO. [33,97,41,105] CHILD A ....> 33,41,97,105 CHILD B ....> 33,41,97,105 CHILD C ....> 33,41,97,105 CHILD D ....> 33,41,97,105 PIN CONFIGURATION OPTION1 PIN CARD [Y,N] CHILD A ....> YES CHILD B ....> YES CHILD C ....> YES CHILD D ....> YES PIN CONFIGURATION OPTION2 PIN CARD [Y,N] CHILD AB ...> YES CHILD CD ...> YES BYPASS CAPACITOR TO 10V/16V PPS (PCON) 1.NON-EXISTENT 2. EXISTENT [1,2] ..............> 1 BYPASS CAPACITOR TO HV PPS (PCON) 1.NON-EXISTENT 2. EXISTENT [1,2] ..............> 1 CONFIGURATION OF DPU 1'ST DPU : STN 1,2 [Y,N] ..........................> YES 2'ND DPU : STN 1,2 [Y,N] ..........................> NO TEST HEAD 1 DC CONFIGURATION [1-16] .............> 1-16 10V PPS CONFIGURATION [1-32] .............> 1-32 16V PPS CONFIGURATION [17-32] ............> HV PPS CONFIGURATION [1-4] .............> TEST HEAD 2 DC CONFIGURATION [1-16] .............> 1-16 10V PPS CONFIGURATION [1-32] .............> 1-32 16V PPS CONFIGURATION [17-32] ............> HV PPS CONFIGURATION [1-4] .............> 1'ST GPIB I/F BOARD 0.NONE 1.BGR-010944X01 2.BGR-010944X02 3.BGR-010944X03 4.BGR-010944X04 5.BGK-012718 [0-5] .........> 0 2'ND GPIB I/F BOARD 0.NONE 1.BGR-016793 (DPU I/F) 2.BGR-010944X05 3.BGK-012718X02 [0-3] .........> 1 DMM TYPE 1.TR6861 2.R6871E 3.R6551 4.R6552T [1-4] .........> 4 AC FREQUENCY (HERTZ) [50,60] ........................> 60 CONFIGURATION OF FM NUMBER OF FM BOARD [0-4] .........> 4 SIZE OF FM MODULE 1. 1M 2. 4M 3. 8M [1-3] .........> 1 NUMBER OF MEMORY BANK [1-2] .........> 1 NUMBER OF MEMORY BLOCK [1-4] .........> 4 PATTERN MEMORY [Y,N] .........> NO FM BOARD KIND 1. BGR-020816 2. BGR-020816X02 [1-2] ..............> 2 CONFIGURATION OF MRA MRA2/3 OPTION [Y,N] ...........................> YES MRA OPTION TYPE [2,3] (2=MRA2,3=MRA3) ...........> 2 TYPE OF CBU BOARD [1,2] (1: BGR-019267 ) (2: BGR-019267X02) ....> 1 NUMBER OF CBU BOARD [1,2,3,4] .......................> 2 TYPE OF FBM BOARD [1,2,3,4] (1= 4M*36BIT) (2= 4M*72BIT) (3= 8M*72BIT) (4=16M*72BIT) .........> 3 NUMBER OF FBM BOARD [1-4] ...........................> 4 COMPRESSION FUNCTION [Y,N] ...........................> NO CONFIGURATION OF FCDC FLASH OPTION [Y,N] ...........................> YES SC BOARD KIND 1. BGR-020774 2. BGR-020774X02 [1-2] ..............> 1 Currently stored in a warehouse 1997 vintage.

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ADVANTEST T 5335P is a FINAL TEST equipment designed for engineers and professionals in various fields, such as electronics, automotive, and robotics. This system provides high-end solutions for performing tests related to unit-level verification and debugging. ADVANTEST T5335P offers a comprehensive range of test-programming capability and comprehensive tests; precise machine test scenarios, verification, debugging, analysis, and optimization of multi-core tool-on-chip (SoC) devices. It includes a programmable digital signal processing (DSP) platform that can help configure analog-to-digital and digital-to-analog signal conversion to create custom test solutions. Additionally, electronic devices can be powered up via Programmable Power Supplies (PPS) while also acquiring detailed design data using oscilloscopes. Advanced testing tools, such as Fast Fourier Transform (FFT) and Vector Signal Analyzers can help configure and optimize signal processing, as well as simulation and emulation solutions. T 5335 P can also be used to Semiconductor Parametric Test (SIP) for parameter estimation and validation. Furthermore, this test asset allows for signal and time correlation for applications such as audio and video testing. Testing can be done in both, standby and active modes. Finally, T 5335P offers debug-time reductions for production runs and advanced debugging capabilities with real-time breakpoints and trace captures. It is also equipped with data management features to ensure accurate and efficient hardware and software testing. This includes Big Data Storage (BDS) options with the ability to store a wide variety of test data, including Waveforms and Timing Diagrams. Overall, it is an advanced test model with a versatile range of Final Test solutions.