Used ADVANTEST T 5335P #293746862 for sale

ADVANTEST T 5335P is a Final Test equipment that enables large-scale wafer level test. This highly efficient system is well-suited for a wide range of semiconductor components, including processors, memories, opto-electronic, display, and storage products. The unit offers a comprehensive set of test capabilities such as parametric, functional and analog tests, as well as test time reduction using the high speed DFT type scanning of I/O channels. ADVANTEST T5335P is designed to ensure high throughput and low cost of test with its high-speed, multi-die testing capabilities. In order to keep up with the latest high-speed testing requirements, the machine has a multi-site LVDS substrate I/O scanning speed of up to 18 Gbps/2.5 Gbps and PARATEST pattern backup capability. Additionally, it can accurately determine the correct nominal speed with its built-in genlock clock generation function and double edge phase function. T 5335 P also features a high-quality inspection tool that is able to detect defects at an extremely low level. It is capable of detecting open/short circuits, parametric defects, and optical defects by utilizing a 14-bit A/D converter and digital I/O channels. The asset also includes a multi-die pattern generator with 1K-pin pattern support capability for testing devices with many I/O channels. Finally, T5335P has user-friendly operation, with built-in tools such as programmable test point naming, diagram visual editor, and command recorder for faster operation. The model also supports easy program shift from wafer to wafer, with its advanced sorting functions allowing faster and easier programming. Moreover, the equipment offers flexibility with its versatile form factors including as single and dual multi-head faceplate and optional accessories such as harness and cable linkage mechanism. Overall, ADVANTEST T 5335 P Final Test System is an effective, reliable and cost-effective unit that is ideal for large-scale and high-volume semiconductor testing needs. It provides a comprehensive arsenal of high-quality testing capabilities, easy programming and flexibility, enabling the test process to be completed quickly and accurately.