Used ADVANTEST T 5335P #9178728 for sale

Name: ADVANTEST T 5335P
Brand: ADVANTEST
SKU: 9178728
Availability: InStock

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Final Test

Manufacturer

ADVANTEST

Model

T 5335P

ID: 9178728

Wafer Size: 12"

Vintage: 1996

Memory tester, 12" System configuration generate Configuration of test head Number of test head [1,2] ...........................>[2] Configuration of test head 1 Test head type 1.650CH 2.1300CH [1,2] .....................> [1] Pin configuration Slot no. [33,97,41,105] Child A ....> [33,41,97,105˙] Child B ....> [33,41,97,105˙] Child C ....> [33,41,97,105˙] Child D ....> [33,41,97,105˙] Pin configuration Option1 PIN CARD [Y,N] Child A ....> [Yes] Child B ....> [Yes] Child C ....> [Yes] Child D ....> [Yes] Pin configuration Option2 Pin card [Y,N] Child AB ...> [Yes] Child CD ...> [Yes] Bypass capacitor to 10V/16V PPS (PCON) 1. Non existent 2. Existent [1,2] ..............> [1] Bypass capacitor to HV PPS (PCON) 1. Non existent 2. Existent [1,2] ..............> [1] Configuration of test head 2 Test head type 1.650CH 2.1300CH [1,2] [1] Pin configuration Slot no. [33,97,41,105] Child A: [33,41,97,105] Child B: [33,41,97,105] Child C: [33,41,97,105] Child D: [33,41,97,105] Pin configuration Option1 pin card [Y,N] Child A [Yes] Child B [Yes] Child C [Yes] Child D [Yes] Pin configuration Option2 pin card [Y,N] Child AB [Yes] Child CD [Yes] Bypass capacitor to 10V/16V PPS (PCON) 1. Non-existent 2. Existent [1,2] [1] Bypass capacitor to HV PPS (PCON) 1. Non-existent 2. Existent [1,2] [1] Configuration of DPU 1'ST DPU : STN 1,2 [Y,N] [Yes] 2'ND DPU : STN 1,2 [Y,N] [Yes] Test head 1 DC Configuration [1-16] [1-16] 10V PPS Configuration [1-32] [1-32] 16V PPS Configuration [17-32] [˙] HV PPS Configuration [1-4] [1-4] Test head 2 DC Configuration [1-16] [1-16] 10V PPS Configuration [1-32] [1-32] 16V PPS Configuration [17-32] [˙] HV PPS Configuration [1-4] [1-4] 1'ST GPIB I/F Board 0.No 1.BGR-010944X01 2.BGR-010944X02 3.BGR-010944X03 4.BGR-010944X04 5.BGK-012718 [0-5] [0] 2'ND GPIB I/F Board 0.No 1.BGR-016793 (DPU I/F) 2.BGR-010944X05 3.BGK-012718X02 [0-3] [1] DMM Type 1. TR6861 2. R6871E 3. R6551 4. R6552T [1-4] [3] AC Frequency (Hertz) [50,60] [60] Configuration of FM Number of FM board [0-4] [2] Size of FM module 1. 1M 2. 4M 3. 8M [1-3] [1] Number of memory bank [1-2] [2] Number of memory bank [1-4] [4] Pattern memory [Y,N] [No] FM Board kind 1. BGR-020816 2. BGR-020816X02 [1-2] [2] Configuration of MRA MRA2/3 Option [Y,N] [Yes] MRA Option type [2,3] (2=MRA2,3=MRA3) [2] Type of CBU Board [1,2] (1: BGR-019267) (2: BGR-019267X02) ....> [1] Number of CBU Board [1,2] [2] Type of FBM Board [1,2,3,4] (1= 2M*72BIT) (2= 4M*72BIT) (3= 8M*72BIT) (4=16M*72BIT) .........> [1] Number of FBM Board [1-4] [4] Compression function [Y,N] [No] Configuration of FCDC Flash option [Y,N] [No] SC Board kind 1. BGR-020774 2. BGR-020774X02 [1-2] [1] End save 1996 vintage.

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ADVANTEST T 5335P is a comprehensive Final Test equipment designed to rapidly assess the performance of today's high-density and complex integrated circuits (ICs). The system consists of a platform of instruments including an IC tester, handlers, and various test heads. The tester is equipped with a broad range of universal and user-programmable test programs, allowing users to easily and confidently test a variety of ICs. ADVANTEST T5335P tester is capable of high-speed data acquisition and can accurately analyze data while setting tests. Its maintenance-free, long-life design helps to ensure a reliable performance even in high temperature and harsh environmental conditions. Its user-friendly graphical user interface allows for easy operation and programming and includes various features to enable safe execution of tests. T 5335 P IC tester is highly accurate and can detect even the smallest of defects in ICs. Its high density test features allow it to handle ICs with up to 1608 pins. Its automatic test generation feature quickly builds tests for different ICs, saving both time and money. Moreover, the test unit comes with a built-in safety control machine to protect the ICs from damage during testing. T5335P tool is designed to test a variety of ICs including analog ICs, digital logic ICs, MCM ICs, microcontrollers, processors, and application specific ICs. In addition, the asset includes several test heads that are designed to capture electrical information and analyze electrical signals at each pin of the ICs. The model also offers real-time fault diagnosis and allows users to quickly identify any problems during tests. Furthermore, ADVANTEST T 5335 P equipment provides a wide range of additional features to increase the efficiency and accuracy of IC testing. This includes fault simulation and analog parametric testing, as well as data analysis functions such as sort, compare, print and display. Finally, the system is backed by ADVANTEST reliable customer service, making T 5335P an ideal choice for testing high-density and complex ICs.