Used ADVANTEST T 5335P #9311740 for sale

ADVANTEST T 5335P
Manufacturer
ADVANTEST
Model
T 5335P
ID: 9311740
Vintage: 1996
Memory tester Temperature range: 150°C Tester processor: TP4 OS Rev: ASX/U-50: 6.04-1 SunOS Release 5.5.1 ASXUBASE: 2.02 DIAG5335SU (Tester diagnosis): 6.03G TH1: 650 OP1 Pin card OP2 Pin card TH2: 650 OP1 Pin card OP2 Pin card DPU: TH1 DC: 1-8 10V PPS: 1-16 HV PPS: 1-4 TH2: DC: 1-8 10V PPS: 1-16 HV PPS: 1-4 FM: 144 M (4) FM Boards Size of FM module: 1 M (2) Memory banks (4) Memory blocks No patten memory BGR-020816 FM Board MRA: MRA Option: MRA2 Type of CBU board: BGR-019267 (2) CBU Boards Type of FBM board: 2 M (4) FBM Boards No compression function FCDC: Flash option BGR-020774 SC Board 1996 vintage.
ADVANTEST T 5335P is a universal final test equipment designed for testing a wide range of semiconductor ICs. It features a unique and scalable architecture which allows it to be easily configured to meet the needs of the user's specific application. ADVANTEST T5335P can be configured for use in test applications such as general-purpose IC testing, digital signal testing, logic gate testing, high-speed memory and storage testing, RF testing, and analog-mixed signal testing. T 5335 P system utilizes a power-saving design with low-power consumption, compactness, modularity, adaptability, and ease of maintenance. The unit consists of a test head and power module, various measuring boards, LAN and GPIB interfaces, and a host PC. The test head provides a test environment with several testing options such as test-rate range and adaptive pattern generation. The test head contains a 36-channel multiplexer with frequency discrimination, temperature monitor, and current measurement gauge. In addition, the power module can power up to 30 pins with pulsed and dc signals. T 5335P machine also features an advanced test and measurement capability. The tool provides three options for data analysis including on-board analog-to-digital conversion, digital-to-analog conversion (DAC), and on-screen analysis. The high-speed ADC provides multiple analog tests such as gain, frequency response, dynamic range, offset, power-on-time, and voltage measurement. The DAC can accurately generate any frequency, pulse shape, and amplitude as specified by the user. And the on-screen analysis software allows users to create test recipes, export the results to programs such as Excel, and review the results interactively. ADVANTEST T 5335 P asset is also equipped with a variety of safety features. The multi-level voltage freezing prevents undesired power consumption and reduces the power-on time. The built-in stress recognition feature can detect external current leakage and provides a warning when a potential fault occurs. The test board is equipped with short-circuit prevention switches to prevent any damage caused by incorrect connections. In addition, its user-friendly graphical user interface provides advanced capabilities such as remote monitoring and operation of the test model. Overall, T5335P is an advanced and versatile final test equipment. It offers a wide range of testing options and features advanced test and measurement capabilities as well as a variety of safety features. It is designed to provide reliable and accurate results for a wide range of semiconductor testing applications.
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