Used ADVANTEST T 5335P #9311741 for sale
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ID: 9311741
Vintage: 1996
Memory tester
Temperature range: 150°C
Tester processor: TP4
OS Rev:
ASX/U-50: 6.04-1
SunOS Release 5.5.1 ASXUBASE: 2.02
DIAG5335SU (Tester diagnosis): 6.03G
TH1: 650
OP1 Pin card
OP2 Pin card
TH2: 650
OP1 Pin card
OP2 Pin card
DPU: TH1
DC: 1-8
10V PPS: 1-16
HV PPS: 1-4
TH2:
DC: 1-8
10V PPS: 1-16
HV PPS: 1-4
FM: 144 M
(2) FM Boards
Size of FM module: 8 M
Memory bank
(4) Memory blocks
No patten memory
BGR-020816X02 FM Board
MRA:
MRA Option: MRA2
Type of CBU board: BGR-019267
(2) CBU Boards
Type of FBM board: 2 M
(4) FBM Boards
No compression function
FCDC:
Flash option
BGR-020774 SC Board
1996 vintage.
ADVANTEST T 5335P is a final test equipment designed to provide testing capabilities for semiconductor devices. It is a configurable, high-speed test platform that supports up to 10 test heads, allowing customers to optimize their testing processes for maximum test throughput and quality. ADVANTEST T5335P features a test head module that has multiple contact types for diverse device testing requirements, including through-hole devices and packages, as well as micro-bumps and flip chip testing. It also features a powerful motorized prober that uses high resolution special programming of the probe needles to provide precise contact with the device under test (DUT). T 5335 P support an extensive selection of test application software products, enabling customers to develop their own test programs and applications quickly and flexibly. This includes both general-purpose devices and specialized high-frequency test programs that enable characterization and production testing for both established memory and logic devices as well as for emerging technologies such as MEMS and NFC. ADVANTEST T 5335 P's hardware and software system components work together to provide a high-performance test unit platform that is both fast and reliable. Dual on board CPUs accelerate test execution by dividing test sequences between the two CPUs. It also supports up to 72 channels of parallel stimulus and analog and digital funneling which allows multiple test points to be tested in parallel to boost throughput. With T 5335P, customers can achieve test accuracies of up to 4 sigma or better with a wide dynamic range of up to 0.1 to 160 mV. This ensures high precision test data, delivering results that exceed customer expectations. In addition to its advanced hardware features, T5335P can be configured with up to 16 racks of test equipment. With such a configurable machine, customers can access a comprehensive range of test modules and accessories that enable them to cover a broad spectrum of device testing requirements. ADVANTEST T 5335P also features a comprehensive selection of networking and software options that provide customers with a high degree of flexibility, allowing them to tailor their test programs and applications. It is backed by comprehensive service and support offerings that ensure customers stay productive and meet their testing needs
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