Used ADVANTEST T 5335P #9311743 for sale
URL successfully copied!
ID: 9311743
Vintage: 1996
Memory tester
Temperature range: 150°C
Tester processor: TP4
OS Rev:
ASX/U-50: 6.04-1
SunOS Release 5.5.1 ASXUBASE: 2.02
DIAG5335SU (Tester diagnosis): 6.03G
TH1: 650
OP1 Pin card
OP2 Pin card
TH2: 650
OP1 Pin card
OP2 Pin card
DPU: TH1
DC: 1-8
10V PPS: 1-16
HV PPS: 1-4
TH2:
DC: 1-8
10V PPS: 1-16
HV PPS: 1-4
FM: 144 M
(2) FM Boards
Size of FM module: 1 M
Memory bank
(4) Memory blocks
No patten memory
BGR-020816 FM Board
MRA:
MRA Option: MRA2
Type of CBU board: BGR-019267
(2) CBU Boards
Type of FBM board: 2 M, 72 bit
(4) FBM Boards
No compression function
FCDC:
Flash option
BGR-020774 SC Board
1996 vintage.
ADVANTEST T 5335P is a high-performance final test equipment that enables multisite wafer level tests. It is designed to offer superior test speed, accuracy and efficiency for both packaged and wafer-level tests. The system is programmed with the 5335P Test Development Environment (TDE), which is a comprehensive set of tools for designing tests that are tailored to meet the needs of the customer. It can be configured to offer a variety of test patterns and features, including history log, single-site and multisite testing, adjustable test sensitivity, and support for complex tests. The unit also offers on-board hardware and electronics components to ensure accurate and reliable test results. ADVANTEST T5335P utilizes patent-pending wafer handling technology that allows the machine to independently test each test site for up to 8 independent sites. This enables a reduction in test time and associated costs. It is capable of handling up to 8 wafers at a time, and has a maximum throughput of 8 wafers per hour. In addition, the tool provides a comprehensive set of test functions and utilities, including data acquisition, condition checking, and results reporting. The asset is equipped with a Flexible Test platform, which allows model tokens to be used to maintain multiple test configurations and to maximize the utility of the equipment in applications such as for mixed-device wafer tests and high-frequency tests. It also includes a 32-bit processor and multiple modules to accommodate various test requirements, including digital and analog. The system can be further customized to provide additional test capabilities, such as DC and AC tests, high-frequency tests, and fault detection. T 5335 P is designed to meet the requirements of the most demanding tests. It is a robust unit with excellent accuracy, and provides reliable results that are repeatable. This versatile test machine is sure to meet all your high-performance test requirements.
There are no reviews yet