Used ADVANTEST T 5335P #9311746 for sale
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ID: 9311746
Vintage: 1996
Memory tester
Temperature range: 150°C
Tester processor: TP4
OS Rev:
ASX/U-50: 6.04-1
SunOS Release 5.5.1 ASXUBASE: 2.02
DIAG5335SU (Tester diagnosis): 6.03G
TH1: 650
OP1 Pin card
OP2 Pin card
TH2: 650
OP1 Pin card
OP2 Pin card
DPU: TH1
DC: 1-8
10V PPS: 1-16
HV PPS: 1-4
TH2:
DC: 1-8
10V PPS: 1-16
HV PPS: 1-4
FM: 144 M
(2) FM Boards
Size of FM module: 1 M
Memory bank
(4) Memory blocks
No patten memory
BGR-020816 FM Board
MRA:
MRA Option: MRA2
Type of CBU board: BGR-019267
(2) CBU Boards
Type of FBM board: 2 M, 72 Bit
(4) FBM Boards
No compression function
FCDC:
Flash option
BGR-020774 SC Board
1996 vintage.
ADVANTEST T 5335P is a high-performance, multi-site final test equipment designed to meet production requirements for high-volume device testing. It features an intuitively designed GUI (Graphical User Interface) for easy operation and data gathering for maximum process efficiency. It utilizes a high-speed turret test head with a lift capacity of up to 2G, offering the highest throughput on the market and the smallest test head size to accommodate tight spaces. ADVANTEST T5335P is equipped with a flexible test adapter system with configurable channels that include single-ended digital, differential digital, and analog I/Os. Advanced multi-site testing capability is also provided, utilizing up to 816 independent sites in parallel test combinations. T 5335 P offers complete integration with wafer probers and handlers, allowing for seamless transfer of high-speed, multi-site test data. ADVANTEST T 5335 P also supports a wide range of test programs and automatic analysis, including digital pattern generation, cycle Time testing, and output load transient voltage and current measurements. The test unit allows for programmable pulse test options, allowing for the testing of short time events in real time. Furthermore, T5335P offers robust data logging capabilities for each test, enabling highly accurate real time analysis and compliance with regulatory requirements. To ensure maximum reliability, the test machine features a patented alignment technology used for ensuring contact on all contact points. It also features high power isolation transformers, multi-site OVP (output voltage protection) and OCP (output current protection) circuitry, as well as inrush current protection and the use of high quality gold plated spring pins for contact integrity. The tool also offers built in in-situ calibration capabilities to ensure accuracy. Overall, T 5335P is the perfect solution for modern production requirements for final test and post-test analysis. With the highest throughput on the market, configurable multi-site testing, and a high quality, durable design, ADVANTEST T 5335P is the ultimate production solution for device testing.
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