Used ADVANTEST T 5335P #9311752 for sale

ADVANTEST T 5335P
Manufacturer
ADVANTEST
Model
T 5335P
ID: 9311752
Vintage: 1996
Memory tester Temperature range: 150°C Tester processor: TP4 OS Rev: ASX/U-50: 6.04-1 SunOS Release 5.5.1 ASXUBASE: 2.02 DIAG5335SU (Tester diagnosis): 6.03G TH1: 650 No OP1 Pin card No OP2 Pin card TH2: 650 No OP1 Pin card No OP2 Pin card DPU: TH1 DC: 1-8 10V PPS: 1-16 HV PPS: 1-4 TH2: DC: 1-8 10V PPS: 1-16 HV PPS: 1-4 FM: 144 M (2) FM Boards Size of FM module: 1 M Memory bank (4) Memory blocks No patten memory BGR-020816 FM Board MRA: MRA Option: MRA2 Type of CBU board: BGR-019267 (2) CBU Boards Type of FBM board: 2 M, 72 Bit (4) FBM Boards No compression function FCDC: Flash option BGR-020774 SC Board 1996 vintage.
ADVANTEST T 5335P is a final test equipment meant for device characterization and debugging at the integrated circuit (IC) level. It has the ability to configure, measure and analyze electrical circuit on chips ranging from simple to complex, making it an ideal solution for automated testing and device optimization. ADVANTEST T5335P features a flexible platform that provides various configuration and test options, such as high-speed pin multiplexing, high-resolution timing, test scan pattern programming and system integration. It is also able to perform in-circuit tests, making it a powerful tool for debugging and analyzing embedded ICs. The unit has a wide range of features, including precision current measurements, high speed readback rates and a universal programmable logic controller (UPC) for test sequence programming. It has high-speed digital instrumentation, capable of measuring up to 500 million samples per second, and its InterfaceBoard and CommandFile formats are two distinct modes of test integration. T 5335 P also has scalability, able to be expanded from a single to multiple channel setup, allowing for multi-client concurrent testing that increases test throughput. Its embedded data acquisition and reporting machine (DARS) enables flexible store-and-forward test management, with the ability to optimize test efficiency. Furthermore, T5335P is designed for easy maintenance, allowing for users to quickly repair, service and upgrade their tool. ADVANTEST T 5335 P is a powerful and versatile final test asset, perfect for device characterization, optimization and debugging. Its flexible platform and scalability offers a wide range of features and options, providing users the ability to test multiple ICs in a single configuration. With its high-speed testing capabilities and intuitive design, T 5335P is an ideal solution for automated testing and device optimization in the integrated circuit-level.
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