Used ADVANTEST T 5335P #9311754 for sale
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ID: 9311754
Vintage: 1996
Memory tester
Temperature range: 150°C
Tester processor: TP4
OS Rev:
ASX/U-50: 6.04-1
SunOS Release 5.5.1 ASXUBASE: 2.02
DIAG5335SU (Tester diagnosis): 6.03G
TH1: 650
No OP1 Pin card
No OP2 Pin card
TH2: 650
No OP1 Pin card
No OP2 Pin card
DPU: TH1
DC: 1-8
10V PPS: 1-16
HV PPS: 1-4
TH2:
DC: 1-8
10V PPS: 1-16
HV PPS: 1-4
FM: 144 M
(2) FM Boards
Size of FM module: 1 M
Memory bank
(4) Memory blocks
No patten memory
BGR-020816 FM Board
MRA:
MRA Option: MRA2
Type of CBU board: BGR-019267
(2) CBU Boards
Type of FBM board: 8 M, 72 Bit
(4) FBM Boards
No compression function
FCDC:
Flash option
BGR-020774 SC Board
1996 vintage.
ADVANTEST T 5335P is a Final Test Equipment is a versatile multi-functional solution for a wide array of high-reliability devices in the semiconductor industry. It provides flexibility of multiple measurement parameters and high-test accuracy for device testing under complex conditions. ADVANTEST T5335P is a test system based on ADVANTEST fifth-generation R500 mainframe, with high-speed I/O and higher throughput than previous models. ADVANTEST integrated software suite offers a comprehensive range of testing capabilities and maintenance options with intuitive menu-driven, multi-language operation. T 5335 P delivers full-featured digital test solutions for a wide variety of applications. It is a modular unit, allowing users to customize their test requirements using a variety of plug-in boards and fixtures. On-board logic channels and external test instruments like oscilloscopes, power supplies, and counter/timers are supported. The included 3D Force sensing integrates into existing test systems, providing automated force-control testing, and the ProBER™ test machine integration further extends tests to the boundaries of customer process requirements. T 5335P is designed for product development and failure analysis of highly complex semiconductor devices. It meets high-speed operation needs with up to 4GHz, and offers a wide range of waveforms, pulse structures, and measurement functions. The tool is configured with full auto-tuning capabilities, allowing users to quickly optimize test setup for each device tested. Emphasis is placed on maximizing reproducibility and test accuracy in production tests with sophisticated advanced test algorithms. Additionally, the asset incorporates features like accelerated thermal cycling, providing improved screening for highly temperature-sensitive devices. ADVANTEST T 5335 P also comes with a dedicated program for automatic measurement shift correction, enabling improved accuracy and refined sensitivity control. This reduces the need for repeated manual calibration, and enhances measurement consistency for all integrated instruments. Additionally, a powerful built-in machine vision model facilitates inspection and fault localization which increases overall process efficiency. T5335P is a reliable and efficient Final Test Equipment that enables streamlined production test of complex semiconductor devices. It is a powerful and versatile tool that ensures high performance and accuracy in a wide variety of testing applications. With integrated support for advanced test algorithms and machine vision capabilities, the system offers a comprehensive end-to-end test solution with repeatable results across the production process.
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