Used ADVANTEST T 5365P #42505 for sale

Manufacturer
ADVANTEST
Model
T 5365P
ID: 42505
Vintage: 1996
Memory test system, 60 MHz (Qty 2) test head Power: 50 Hz (Qty 8) FM board Size of FM board: 576M Test head type: 1.650CH, 2.1300CH [1,2] Pin configuration, slot no. [30,97,41,105] Child A: 33,41,97,105 Child B: 33,41,97,105 Child C: 33,41,97,105 Child D: 33,41,97,105 Configuration of DPU 1’st DPU: STN 1,2: Yes 2’nd DPU: STN 1,2: No Test head 1 DC config: 1-9 10V PPS config: 1-16 Test head 2 DC config: 1-8 10VPPS config: 1-16 1’st GPIB I/F board 0. None 1. BGR-0106944x01 2. BGR-0106944x02 3. BGR-0106944x03 4. BGR-0106944x04 5. BGK-012718 [0-5] 0 2’nd GPIB I/F Board 0. None 1. BGR-016793 (DPU I/F) 2. BGR-010944x05 3. BGK-012718X02 [0-3] 1 DMM Type TR6861 R6871E R6551 R6552T [1-4] 3 Powered down Warehoused 1996 vintage.
ADVANTEST T 5365P Final Test Equipment is a powerful automated tool for testing semiconductor devices. This system uses cut-edge technology to ensure accurate and consistent testing. The Final Test Unit is built with a highly advanced sensing and testing platform, making use of advanced automated features to speed up the device testing process. The machine comes equipped with the most advanced Vector Matching technology, capable of monitoring and analyzing signals coming from the device being tested at very high speeds. This allows for a more accurate and reliable test. The Tool is equipped with a multi-channel, multi-site Tester Platform, allowing for testing multiple devices at once and also test complex devices. The asset is designed with a modular structure to easily connect multiple testers, up to eight at once, which increases the throughput and expands the model's test coverage. The advanced platform and operation is capable of engaging the tester in parallel and serial test applications, significantly increasing testing capability. The equipment also has multiple data and communication interfaces, supporting various communication and upstream media such as USB, Ethernet, and fibre optic, as well as downstream communication with test lab instruments such as oscilloscopes, laser interferometers, and other similar equipment. This allows for an efficient and flexible operation. T 5365P Final Test System is also equipped with Fault Analysis Optimization. This allows for quicker fault identification and analysis by referring to test results, measurement details, and operation log that is being monitored in real-time. Utilising modern image processing and data analytics for enhanced accuracy and reliability, it will also provide you with statistical values for your test results. The unit also has the ability to handle various testing processes like functional test and IC burn-in. The test designs and execution processes are made intuitive and streamlined with the help of a modern graphical user interface, making it suited for automated production tests and complete machine tests. The tool is capable of device testing in ultra-low power, even down to micro-amps, as well as testing different types of devices like multi-site, unified boundary-scan, parametric, and logic. Overall, ADVANTEST T 5365P Final Test Asset is an advanced, accurate, and reliable device testing model, ideal for product testing and automated production tests. With its modern sensing and testing technology, powerful multi-channel, multi-site Tester Platform, flexible data and communication interface, Fault Analysis Optimization, and modern graphical user interface, it is a powerful tool for the most ambitious product testing applications.
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