Used ADVANTEST T 5371 #162879 for sale
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ID: 162879
Memory test system
Docking with TEL P-12XLn wafer prober
Configuration:
/DIAG/G
SYSTEM CONFIGURATION GENERATE
CONFIGURATION OF TEST HEAD
PIN CONFIGURATION 1. 480DR+320I/O(HALF)
2. 768DR+512I/O(FULL)
3. 960DR+640I/O(FULL)
4. 240DR+160I/O(QUARTER) [1-4] ...> 3
NUMBER OF TEST HEAD [1,2] ...........................> 2
CONFIGURATION OF TEST HEAD 1
PE BOARD TYPE 0.NO BOARD
1.BGM-023206X04 (DR+IO PE,x2 AMP)
2.BGM-023206X05 (DR PE,x2 AMP)
PIN 1 13 25
CHILD A1 ....> 1 1 1
CHILD A3 ....> 1 1 1
CHILD B1 ....> 1 1 1
CHILD B3 ....> 1 1 1
CHILD C1 ....> 1 1 1
CHILD C3 ....> 1 1 1
CHILD D1 ....> 1 1 1
CHILD D3 ....> 1 1 1
CHILD E1 ....> 1 1 1
CHILD E3 ....> 1 1 1
CHILD F1 ....> 1 1 1
CHILD F3 ....> 1 1 1
CHILD G1 ....> 1 1 1
CHILD G3 ....> 1 1 1
CHILD H1 ....> 1 1 1
CHILD H3 ....> 1 1 1
CONFIGURATION OF TEST HEAD 2
PE BOARD TYPE 0.NO BOARD
1.BGM-023206X04 (DR+IO PE,x2 AMP)
2.BGM-023206X05 (DR PE,x2 AMP)
PIN 1 13 25
CHILD A1 ....> 1 1 1
CHILD A3 ....> 1 1 1
CHILD B1 ....> 1 1 1
CHILD B3 ....> 1 1 1
CHILD C1 ....> 1 1 1
CHILD C3 ....> 1 1 1
CHILD D1 ....> 1 1 1
CHILD D3 ....> 1 1 1
CHILD E1 ....> 1 1 1
CHILD E3 ....> 1 1 1
CHILD F1 ....> 1 1 1
CHILD F3 ....> 1 1 1
CHILD G1 ....> 1 1 1
CHILD G3 ....> 1 1 1
CHILD H1 ....> 1 1 1
CHILD H3 ....> 1 1 1
CONFIGURATION OF DPU
1'ST DPU : STN 1,2 [Y,N] ..........................> YES
TEST HEAD 1 DC CONFIGURATION [1-32] .............> 1-32
PPS CONFIGURATION [1-128] ............> 1-128
TEST HEAD 2 DC CONFIGURATION [1-32] .............> 1-32
PPS CONFIGURATION [1-128] ............> 1-128
AC FREQUENCY (Hz) [50,60] ........................> 60
CONFIGURATION OF FTU
FLASH OPTION [Y,N] ...........................> YES
CONFIGURATION OF FM
TYPE OF FM [1:NORMAL(AFM), 2:MRA4(FMRA)] ............> 2
NUMBER OF FMRA BOARD [0-8] ...........................> 8
SIZE OF FMRA BOARD [0,0G, 1:1G, 2:4G] ..............> 1
PM(PATTERN MEMORY) BOARD EXIST [Y,N] .................> YES
SIZE OF PM BOARD [1:576M] ..........................> 1
END SAVE
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ADVANTEST T 5371 is an advanced final test equipment that offers a combination of high-performance, high flexibility and cost-effectiveness. This system is ideal for testing a range of applications, from consumer products to semiconductor devices. It is based on the V93000 platform, which provides a variety of features such as advanced test development, high-speed processing and high-resolution analyzing capabilities. This platform helps to reduce development time, increase test accuracy and performance. ADVANTEST T5371 also features high scalability and modularity, allowing users to easily expand the unit to meet their specific needs. Its efficient power management design allows for higher test throughput and better energy efficiency. In addition, this final test machine provides built-in fault detection, which is essential for ensuring the highest quality and reliability. The tool is equipped with high-speed programmable digital electronics that can achieve fast-pulse testing with consistent results. This feature drastically reduces the time needed to perform tests and avoid errors. The advanced sequencing technology further increases accuracy and reduces testing time. Its user-friendly GUI design supports a wide array of applications. This assists users in creating complex test programs, such as separating test operations into multiple concurrent threads. This increases efficiency in testing and allows users to identify subtle faults quicker. T 5371 also provides an easy-to-use data analysis asset that helps users identify, analyze and report on failure detection, pass/fail results and operation history data. This helps ensure that users obtain the most reliable and accurate results from the model. The final test equipment is designed to offer a comprehensive solution that meets all of your needs. With its advanced features and user-friendly design, T5371 is an ideal system for companies that require reliable, high performance and cost effective test solutions.
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