Used ADVANTEST T 5371 #9021550 for sale
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ID: 9021550
Vintage: 2000
Tester
CONFIGURATION OF TEST HEAD
PIN CONFIGURATION 1. 480DR+320I/O(HALF)
2. 768DR+512I/O(FULL)
3. 960DR+640I/O(FULL)
4. 240DR+160I/O(QUARTER) [1-4] ...> 3
NUMBER OF TEST HEAD [1,2] ...........................> 1
CONFIGURATION OF TEST HEAD 1
PE BOARD TYPE 0.NO BOARD
1.BGM-023206X04 (DR+IO PE,x2 AMP)
2.BGM-023206X05 (DR PE,x2 AMP)
PIN 1 13 25
CHILD A1 ....> 1 1 1
CHILD A3 ....> 1 1 1
CHILD B1 ....> 1 1 1
CHILD B3 ....> 1 1 1
CHILD C1 ....> 1 1 1
CHILD C3 ....> 1 1 1
CHILD D1 ....> 1 1 1
CHILD D3 ....> 1 1 1
CHILD E1 ....> 1 1 1
CHILD E3 ....> 1 1 1
CHILD F1 ....> 1 1 1
CHILD F3 ....> 1 1 1
CHILD G1 ....> 1 1 1
CHILD G3 ....> 1 1 1
CHILD H1 ....> 1 1 1
CHILD H3 ....> 1 1 1
CONFIGURATION OF DPU
1'ST DPU : STN 1,2 [Y,N] ..........................> YES
TEST HEAD 1 DC CONFIGURATION [1-32] .............> 1-32
PPS CONFIGURATION [1-128] ............> 1-128
AC FREQUENCY (Hz) [50,60] ........................> 60
CONFIGURATION OF FTU
FLASH OPTION [Y,N] ...........................> YES
CONFIGURATION OF FM
TYPE OF FM [1:NORMAL(AFM), 2:MRA4(FMRA)] ............> 1
NUMBER OF AFM BOARD [0-8] ............................> 4
SIZE OF AFM BOARD [1:1G, 2:4G] .....................> 1
PM(PATTERN MEMORY) BOARD EXIST [Y,N] .................> YES
SIZE OF PM BOARD [1:576M] ..........................> 1
2000 vintage.
ADVANTEST T 5371 is a Final Test Equipment. It is designed to provide maximum testing throughput for the latest advanced devices. This advanced test system combines reliable, high-speed testing with an easy-to-use user interface and an extensive range of test features. ADVANTEST T5371 is built on an advanced testing architecture that is optimized for efficient testing of the latest advanced devices. Its high-speed processor unit boasts a fast data transfer rate which allows for parallel testing of multiple nodes. The unit also features a well-defined and easy-to-use user interface which makes it easy to access and control tests. Furthermore, the test machine includes a range of advanced features such as programmable modules, parametric and temperature testing, and automated test flow management. T 5371 is designed for rapid device testing with its high-speed testing engine. It has a large memory capacity and a high performance signal test process which allows for fast testing of multiple modules at once. The tool also allows for testing of distributed testing nodes over a network and can be set up to perform multiple parallel tests simultaneously. T5371 also has extensive diagnostic capabilities that allow for detailed analysis of device performance. It includes a suite of diagnostic and parametric tools for comprehensive analysis of device behavior. Furthermore, it includes an integrated data logging and reporting asset to facilitate fast problem resolution. Finally, ADVANTEST T 5371 also has a range of safety features which allow for safe testing of advanced devices. It includes programmable safety algorithms to monitor device parameters and limit excessive current or voltage. Furthermore, it provides drop-in voltage protection to prevent any potential damage to the device due to sudden voltage changes. Overall, ADVANTEST T5371 is an advanced test model that provides maximum testing throughput and a range of advanced testing features for the latest devices. It is optimized for efficient testing and includes integrated diagnostic and safety features that allow for safe and comprehensive analysis of device performance.
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