Used ADVANTEST T 5371 #9123475 for sale
URL successfully copied!
ID: 9123475
Tester
Pogo tower M/B
SYSTEM CONFIGURATION GENERATE
CONFIGURATION OF TEST HEAD
PIN CONFIGURATION 1. 480DR+320I/O(HALF)
2. 768DR+512I/O(FULL)
3. 960DR+640I/O(FULL)
4. 240DR+160I/O(QUARTER) [1-4] ...> 3
NUMBER OF TEST HEAD [1,2] ...........................> 2
CONFIGURATION OF TEST HEAD 1
PE BOARD TYPE 0.NO BOARD
1.BGM-023206X04 (DR+IO PE,x2 AMP)
2.BGM-023206X05 (DR PE,x2 AMP)
PIN 1 13 25
CHILD A1 ....> 1 1 1
CHILD A3 ....> 1 1 1
CHILD B1 ....> 1 1 1
CHILD B3 ....> 1 1 1
CHILD C1 ....> 1 1 1
CHILD C3 ....> 1 1 1
CHILD D1 ....> 1 1 1
CHILD D3 ....> 1 1 1
CHILD E1 ....> 1 1 1
CHILD E3 ....> 1 1 1
CHILD F1 ....> 1 1 1
CHILD F3 ....> 1 1 1
CHILD G1 ....> 1 1 1
CHILD G3 ....> 1 1 1
CHILD H1 ....> 1 1 1
CHILD H3 ....> 1 1 1
CONFIGURATION OF TEST HEAD 2
PE BOARD TYPE 0.NO BOARD
1.BGM-023206X04 (DR+IO PE,x2 AMP)
2.BGM-023206X05 (DR PE,x2 AMP)
PIN 1 13 25
CHILD A1 ....> 1 1 1
CHILD A3 ....> 1 1 1
CHILD B1 ....> 1 1 1
CHILD B3 ....> 1 1 1
CHILD C1 ....> 1 1 1
CHILD C3 ....> 1 1 1
CHILD D1 ....> 1 1 1
CHILD D3 ....> 1 1 1
CHILD E1 ....> 1 1 1
CHILD E3 ....> 1 1 1
CHILD F1 ....> 1 1 1
CHILD F3 ....> 1 1 1
CHILD G1 ....> 1 1 1
CHILD G3 ....> 1 1 1
CHILD H1 ....> 1 1 1
CHILD H3 ....> 1 1 1
CONFIGURATION OF DPU
1'ST DPU : STN 1,2 [Y,N] ..........................> YES
TEST HEAD 1 DC CONFIGURATION [1-32] .............> 1-32
PPS CONFIGURATION [1-128] ............> 1-128
TEST HEAD 2 DC CONFIGURATION [1-32] .............> 1-32
PPS CONFIGURATION [1-128] ............> 1-128
AC FREQUENCY (Hz) [50,60] ........................> 60
CONFIGURATION OF FTU
FLASH OPTION [Y,N] ...........................> YES
CONFIGURATION OF FM
TYPE OF FM [1:NORMAL(AFM), 2:MRA4(FMRA)] ............> 2
NUMBER OF FMRA BOARD [0-8] ...........................> 8
PM(PATTERN MEMORY) BOARD EXIST [Y,N] .................> YES.
ADVANTEST T 5371 Final Test Equipment is a production grade tester designed for testing devices in the most reliable and cost-efficient manner possible. The system has been designed with the idea of allowing users to quickly and accurately evaluate device performance under a variety of scenarios and is well-suited for maximizing quality and yield of production processes. ADVANTEST T5371 features a modular design, and is easily customized to meet the needs of each customer. The adaptable set of test channels allows testing to be optimized with highly flexible 3 or 4 wire configurations. Programmable set-ups also allow for quick and easy testing of a wide variety of devices while minimizing the need for additional test fixtures or custom parts. The test unit is also equipped with a high-speed test bus, designed to speed up test processes. This machine can quickly preform operation checks, tests, and measurements at speeds up to 8μs/point. Additionally, the tool supports a number of device types, including analog ICs, MOS, transistors, and inter-digital devises. Additional features of T 5371 include a comprehensive library of standard tests, test programs and program libraries, a variety of options for distributed testing, and an all-in-one user interface specifically designed for easy operation and validation. Error detection and diagnostic capabilities are also provided, allowing users to quickly identify and fix test errors. T5371 is a reliable and powerful test asset, providing users with a comprehensive tool for quickly and accurately evaluating device performance. Its efficient modular design, high speed test bus, and error detection capabilities make it the ideal solution for maximizing productivity and yield while ensuring the quality of device production.
There are no reviews yet