Used ADVANTEST T 5371 #9173456 for sale
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ID: 9173456
Vintage: 2001
Memory testers
SYSTEM CONFIGURATION GENERATE
CONFIGURATION OF TEST HEAD
PIN CONFIGURATION 1. 480DR+320I/O(HALF)
2. 768DR+512I/O(FULL)
3. 960DR+640I/O(FULL)
4. 240DR+160I/O(QUARTER) [1-4] ...> 3
NUMBER OF TEST HEAD [1,2] ...........................> 2
CONFIGURATION OF TEST HEAD 1
PE BOARD TYPE 0.NO BOARD
1.BGM-023206X04 (DR+IO PE,x2 AMP)
2.BGM-023206X05 (DR PE,x2 AMP)
PIN 1 13 25
CHILD A1 ....> 1 1 1
CHILD A3 ....> 1 1 1
CHILD B1 ....> 1 1 1
CHILD B3 ....> 1 1 1
CHILD C1 ....> 1 1 1
CHILD C3 ....> 1 1 1
CHILD D1 ....> 1 1 1
CHILD D3 ....> 1 1 1
CHILD E1 ....> 1 1 1
CHILD E3 ....> 1 1 1
CHILD F1 ....> 1 1 1
CHILD F3 ....> 1 1 1
CHILD G1 ....> 1 1 1
CHILD A1 ....> 1 1 1
CHILD A3 ....> 1 1 1
CHILD B1 ....> 1 1 1
CHILD B3 ....> 1 1 1
CHILD C1 ....> 1 1 1
CHILD C3 ....> 1 1 1
CHILD D1 ....> 1 1 1
CHILD D3 ....> 1 1 1
CHILD E1 ....> 1 1 1
CHILD E3 ....> 1 1 1
CHILD F1 ....> 1 1 1
CHILD F3 ....> 1 1 1
CHILD G1 ....> 1 1 1
CHILD G3 ....> 1 1 1
CHILD H1 ....> 1 1 1
CHILD H3 ....> 1 1 1
CONFIGURATION OF DPU
1'ST DPU : STN 1,2 [Y,N] ..........................> YES
TEST HEAD 1 DC CONFIGURATION [1-32] .............> 1-32
PPS CONFIGURATION [1-128] ............> 1-128
TEST HEAD 2 DC CONFIGURATION [1-32] .............> 1-32
PPS CONFIGURATION [1-128] ............> 1-128
AC FREQUENCY (Hz) [50,60] ........................> 60
CONFIGURATION OF FTU
FLASH OPTION [Y,N] ...........................> NO
CONFIGURATION OF FM
TYPE OF FM [1:NORMAL(AFM), 2:MRA4(FMRA)] ............> 2
NUMBER OF FMRA BOARD [0-8] ...........................> 8
SIZE OF FMRA BOARD [1:1G, 2:4G] ....................> 1
PM(PATTERN MEMORY) BOARD EXIST [Y,N] .................> YES
SIZE OF PM BOARD [1:576M] ..........................> 1
END SAVE
2001 vintage.
ADVANTEST T 5371 is a final test equipment, used primarily for device characterization and test. The system provides a range of measurements, covering the spectrum of test parameters including device DC measurements, analog/digital testing, device modeling, yield analysis, and failure analysis. Features of ADVANTEST T5371 unit include an advanced device analysis module, which offers a suite of measurement tools and techniques for the characterization of analog and digital devices. It allows for the testing and verification of a wide range of device functionality using a range of tools, including pattern recognition, pulse response, slew rate control, spectrum analysis, eye diagram measurement, and automated bit error rate testing. The machine also features a comprehensive failure analysis module, which is used to detect, characterize, and isolate device faults, such as shorts, opens, voltage irregularities, and IR drop. This enables users to quickly and effectively investigate, diagnose, and correct device failures. Additionally, the tool offers a powerful device modeling module, allowing users to analyze the behavior of the device under test, providing critical information regarding the device's design and relative performance. This is especially useful for failure analysis tasks, as it allows users to quickly identify problem areas before performing detailed measurements. T 5371 also includes a yield analysis module, which is used to analyze test results and provide detailed information regarding device yield. This includes data regarding yield trends, Go/No-Go test results, and peak performance metrics. Using these metrics, users can accurately identify and address any yield issues, helping to improve overall device quality. Finally, T5371 is a highly flexible asset, featuring an extensible architecture which allows users to easily integrate and extend the model to meet their specific requirements. This includes the ability to add or remove instruments and accessories, as well as to expand the equipment's memory and performance capabilities. Furthermore, the system offers software support for Windows, Linux, and MacOS, allowing users to access and control the unit from virtually any platform. All in all, ADVANTEST T 5371 is a comprehensive, modular, and highly extensible final test machine, designed to provide users with an efficient, reliable, and cost-effective solution for any device characterization and test needs. The tool offers a wide range of measurement capabilities and features, as well as unmatched flexibility and ease of use, making it an ideal choice for a variety of applications.
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