Used ADVANTEST T 5371 #9190447 for sale
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ID: 9190447
Wafer Size: 12"
Vintage: 2010
Memory testers, 12"
SYSTEM CONFIGURATION GENERATE
CONFIGURATION OF TEST HEAD
PIN CONFIGURATION 1. 480DR+320I/O(HALF)
2. 768DR+512I/O(FULL)
3. 960DR+640I/O(FULL)
4. 240DR+160I/O(QUARTER) [1-4] ...> 3
NUMBER OF TEST HEAD [1,2] ...........................> 2
CONFIGURATION OF TEST HEAD 1
PE BOARD TYPE 0.NO BOARD
1.BGM-023206X04 (DR+IO PE,x2 AMP)
2.BGM-023206X05 (DR PE,x2 AMP)
PIN 1 13 25
CHILD A1 ....> 1 1 1
CHILD A3 ....> 1 1 1
CHILD B1 ....> 1 1 1
CHILD B3 ....> 1 1 1
CHILD C1 ....> 1 1 1
CHILD C3 ....> 1 1 1
CHILD D1 ....> 1 1 1
CHILD D3 ....> 1 1 1
CHILD E1 ....> 1 1 1
CHILD E3 ....> 1 1 1
CHILD F1 ....> 1 1 1
CHILD F3 ....> 1 1 1
CHILD G1 ....> 1 1 1
CHILD A1 ....> 1 1 1
CHILD A3 ....> 1 1 1
CHILD B1 ....> 1 1 1
CHILD B3 ....> 1 1 1
CHILD C1 ....> 1 1 1
CHILD C3 ....> 1 1 1
CHILD D1 ....> 1 1 1
CHILD D3 ....> 1 1 1
CHILD E1 ....> 1 1 1
CHILD E3 ....> 1 1 1
CHILD F1 ....> 1 1 1
CHILD F3 ....> 1 1 1
CHILD G1 ....> 1 1 1
CHILD G3 ....> 1 1 1
CHILD H1 ....> 1 1 1
CHILD H3 ....> 1 1 1
CONFIGURATION OF DPU
1'ST DPU : STN 1,2 [Y,N] ..........................> YES
TEST HEAD 1 DC CONFIGURATION [1-32] .............> 1-32
PPS CONFIGURATION [1-128] ............> 1-128
TEST HEAD 2 DC CONFIGURATION [1-32] .............> 1-32
PPS CONFIGURATION [1-128] ............> 1-128
AC FREQUENCY (Hz) [50,60] ........................> 60
CONFIGURATION OF FTU
FLASH OPTION [Y,N] ...........................> NO
CONFIGURATION OF FM
TYPE OF FM [1:NORMAL(AFM), 2:MRA4(FMRA)] ............> 2
NUMBER OF FMRA BOARD [0-8] ...........................> 8
SIZE OF FMRA BOARD [1:1G, 2:4G] ....................> 1
PM(PATTERN MEMORY) BOARD EXIST [Y,N] .................> YES
SIZE OF PM BOARD [1:576M] ..........................> 1
END SAVE
Include: Mother board
2010 vintage.
ADVANTEST T 5371 is a top market-tested final test equipment suitable for a wide range of semiconductor devices. It is a fully automated, easy-to-use, reliable, and cost-effective solution for any final test requirements, allowing multiple tests to be performed on a single device. This is achieved by utilizing high-speed signal response testing, high-precision measurement performance, and efficient resource utilization capabilities. ADVANTEST T5371 has a modular structure and a range of available Custom Micro-Controllers (CMCs). The CMCs make it possible for the system to meet high-speed signal response testing requirements for up to four technologies in parallel. The CMCs also incorporate a wide range of high-end features such as digital signal processing, signal control functions and customized encryption. In addition to its highly reliable signal response testing capabilities, T 5371 delivers an exceptionally high level of accuracy and repeatability in measurement performance. T5371 utilizes a range of steps including a high precision floating-point processor, an extremely precise amplifier and a wide range of precision analog-to-digital converters. These components are coupled with highly sophisticated signal-to-noise and interference suppression algorithms, which allow for extremely accurate measurements at all test frequencies. ADVANTEST T 5371 also incorporates a comprehensive range of resource utilization tools, which allows for the most efficient use of resources during test operations. ADVANTEST T5371 includes multiple testing modes such as multi-session operation, multiple product operation and multiple testing methods, which allows for efficient utilization of hardware and software resources. Furthermore, the unit also supports a range of customization options, enabling users to design their own automation process for each product. To ensure continuous high-quality test results, T 5371 is equipped with an advanced fault-tolerant monitoring machine. This tool is designed to detect, monitor and alert users when the asset is not meeting performance targets or requires maintenance. T5371 is a market-leading final test model that offers users an effective, cost-efficient solution for their testing needs. It is a reliable, easy-to-use and highly accurate equipment that has been proven to deliver exceptional results in a wide range of semiconductor device tests.
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