Used ADVANTEST T 5371 #9209763 for sale

Name: ADVANTEST T 5371
Brand: ADVANTEST
SKU: 9209763
Availability: InStock

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Final Test

Manufacturer

ADVANTEST

Model

T 5371

ID: 9209763

Memory tester SYSTEM CONFIGURATION GENERATE CONFIGURATION OF TEST HEAD PIN CONFIGURATION 1. 480DR+320I/O(HALF) 2. 768DR+512I/O(FULL) 3. 960DR+640I/O(FULL) 4. 240DR+160I/O(QUARTER) [1-4] ...> 3 NUMBER OF TEST HEAD [1,2] ...........................> 2 CONFIGURATION OF TEST HEAD 1 PE BOARD TYPE 0.NO BOARD 1.BGM-023206X04 (DR+IO PE,x2 AMP) 2.BGM-023206X05 (DR PE,x2 AMP) PIN 1 13 25 CHILD A1 ....> 1 1 1 CHILD A3 ....> 1 1 1 CHILD B1 ....> 1 1 1 CHILD B3 ....> 1 1 1 CHILD C1 ....> 1 1 1 CHILD C3 ....> 1 1 1 CHILD D1 ....> 1 1 1 CHILD D3 ....> 1 1 1 CHILD E1 ....> 1 1 1 CHILD E3 ....> 1 1 1 CHILD F1 ....> 1 1 1 CHILD F3 ....> 1 1 1 CHILD G1 ....> 1 1 1 CHILD G3 ....> 1 1 1 CHILD H1 ....> 1 1 1 CHILD H3 ....> 1 1 1 CONFIGURATION OF TEST HEAD 2 PE BOARD TYPE 0.NO BOARD 1.BGM-023206X04 (DR+IO PE,x2 AMP) 2.BGM-023206X05 (DR PE,x2 AMP) PIN 1 13 25 CHILD A1 ....> 1 1 1 CHILD A3 ....> 1 1 1 CHILD B1 ....> 1 1 1 CHILD B3 ....> 1 1 1 CHILD C1 ....> 1 1 1 CHILD C3 ....> 1 1 1 CHILD D1 ....> 1 1 1 CHILD D3 ....> 1 1 1 CHILD E1 ....> 1 1 1 CHILD E3 ....> 1 1 1 CHILD F1 ....> 1 1 1 CHILD F3 ....> 1 1 1 CHILD G1 ....> 1 1 1 CHILD G3 ....> 1 1 1 CHILD H1 ....> 1 1 1 CHILD H3 ....> 1 1 1 CONFIGURATION OF DPU 1'ST DPU : STN 1,2 [Y,N] ..........................> YES TEST HEAD 1 DC CONFIGURATION [1-32] .............> 1-32 PPS CONFIGURATION [1-128] ............> 1-128 TEST HEAD 2 DC CONFIGURATION [1-32] .............> 1-32 PPS CONFIGURATION [1-128] ............> 1-128 AC FREQUENCY (Hz) [50,60] ........................> 50 CONFIGURATION OF FTU FLASH OPTION [Y,N] ...........................> YES CONFIGURATION OF FM TYPE OF FM [1:NORMAL(AFM), 2:MRA4(FMRA)] ............> 1 NUMBER OF AFM BOARD [0-8] ............................> 0 PM(PATTERN MEMORY) BOARD EXIST [Y,N] .................> YES SIZE OF PM BOARD [1:576M] ..........................> 1 END SAVE.

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ADVANTEST T 5371 is a Final Test Equipment designed to perform a wide range of system-specific test functions for a range of end products. This versatile unit is suitable for all test stages, from device characterization and validation to board-level functional and functional verification. The versatile ADVANTEST T5371 provides easy installation, allowing end products to be tested with multiple test applications. It is based on a modular, open hardware platform, and offers a unique combination of hardware and software technologies, allowing for flexible reconfigurability. It offers a variety of test application capabilities, including parametric and functional tests, static and dynamic tests, multiplexing and targeted tests and engineering test configurations. The unit's Test Management Software is designed to simplify programming and the development of customer-specified tests. It features an intuitive graphical user interface, which enables users to quickly customize the unit and launch test modules. T 5371 also comes with an extensive library of native test programs and advanced test and analysis tools. T5371 is equipped with powerful pattern generation/inspection capabilities and is capable of multi-channel test coverage. It offers communication protocols, including CAN and Ethernet, plus data transfer between the test controller and instruments. The advanced built-in buck/boost function, along with the power supply, is designed to ensure efficient and optimum power delivery for end-products. ADVANTEST T 5371 also provides advanced diagnostics and data logging, enabling machine-level test verification, quickly and easily. The unique diagnostic library uses easy-to-navigate menus and is based on an industry-standard format, allowing error codes to be matched to specific hardware components. Finally, the unit is also compatible with a wide range of test applications, and includes diagnostic and reporting software. The tool also includes comprehensive documentation, making it an easily implementable and comprehensive solution for final test capabilities.