Used ADVANTEST T 5371 #9238983 for sale
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ID: 9238983
Vintage: 2004
Memory tester
Single head
SYSTEM CONFIGURATION GENERATE
CONFIGURATION OF TEST HEAD:
PIN CONFIGURATION:
1. 480DR+320I/O (HALF)
2. 768DR+512I/O (FULL)
3. 960DR+640I/O (FULL)
4. 240DR+160I/O (QUARTER) [1-4] ...> 4
NUMBER OF TEST HEAD [1,2] ...........................> 1
CONFIGURATION OF TEST HEAD 1
PE BOARD TYPE
0.NO BOARD
1.BGM-023206X04 (DR+IO PE,x2 AMP)
2.BGM-023206X05 (DR PE,x2 AMP)
PIN 1 13 25
CHILD A1 ....> 1 1 1
CHILD A3 ....> 0 0 0
CHILD B1 ....> 1 1 1
CHILD B3 ....> 0 0 0
CHILD C1 ....> 1 1 1
CHILD C3 ....> 0 0 0
CHILD D1 ....> 1 1 1
CHILD D3 ....> 0 0 0
CHILD E1 ....> 0 0 0
CHILD E3 ....> 0 0 0
CHILD F1 ....> 0 0 0
CHILD F3 ....> 0 0 0
CHILD G1 ....> 0 0 0
CHILD G3 ....> 0 0 0
CHILD H1 ....> 0 0 0
CHILD H3 ....> 0 0 0
CONFIGURATION OF DPU
1'ST DPU : STN 1,2 [Y,N] ..........................> YES
TEST HEAD 1:
DC CONFIGURATION [1-32] .............> 1-16
PPS CONFIGURATION [1-128] ............> 1-16
AC FREQUENCY (Hz) [50,60] ........................> 50
CONFIGURATION OF FTU
FLASH OPTION [Y,N] ...........................> NO
CONFIGURATION OF FM
TYPE OF FM [1:NORMAL(AFM), 2:MRA4(FMRA)] ............> 1
NUMBER OF AFM BOARD [0-8] ............................> 2
SIZE OF AFM BOARD [1:1G, 2:4G] .....................> 2
PM(PATTERN MEMORY) BOARD EXIST [Y,N] .................> YES
SIZE OF PM BOARD [1:576M] ..........................> 1
END SAVE
2004 vintage.
ADVANTEST T 5371 final test equipment is an automated tester developed by ADVANTEST Corporation which is designed to offer superior test and measurement performance in a full-featured, integrated system. It is a cost-effective platform for testing high-frequency transistors, RF/microwave components, ICs and other semiconductor devices. For optimal test accuracy and throughput, ADVANTEST T5371 features the TestStudio software suite, which includes a series of easy-to-use screens that let you quickly design and deploy the test program. T 5371 comes with a 1.5GHz RF/microwave measurement, a dynamic range of -121 to +20 dBm, 2048 Signal Channels and a Frequency Range of DC-1.5GHz. Also, it offers an available high-density frequency converter which supports up to 273,223 kHz bandwidth. T5371 is appropriate for testing high-frequency transistors, RF components, SOI and BSI devices, and automatically discriminates between high and low frequency devices. Its Automatic De-embedding removes noise and artifacts from high frequency device tests and permits testing of devices of maximum frequency up to 1.5GHz with one instrument. With its fast high speed control unit, ADVANTEST T 5371 can handle auto-detection and auto-frequency measurement programs at lightning speed, and is suited for advanced critical measurements. ADVANTEST T5371 also features an advanced statistical feature set. This includes the ability to study the mean, standard deviation and distribution of test results, along with complete distribution mapping and test report generation. This feature set helps users to accurately identify the cause and potential solution for any fault found in measurements, thereby reducing the time and resources required to assess and debug test results, while providing the highest level of confidence in production processes. Moreover, the tight integration of TestStudio software with the test machine offers advanced debug analysis and powerful test generation capabilities. This integration allows for easy viewing and processing of raw measurement results, and also provides automated report generations that give engineers the ability to quickly and easily assess the performance of devices under test. Overall, T 5371 is a powerful, easy-to-use final test tool designed to optimize test and measurement accuracy and throughput. With its advanced feature set and tight software integration, it is a great choice for test and measurement professionals in the manufacturing of high-frequency semiconductor devices.
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