Used ADVANTEST T 5372 #9011379 for sale
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ID: 9011379
Testers
Configuration:
SYSTEM CONFIGURATION GENERATE
CONFIGURATION OF TEST HEAD
PIN CONFIGURATION 1. 512DR+320I/O(HALF)
2.1024DR+640I/O(FULL) [1-2] ...> 2
NUMBER OF TEST HEAD [1,2] ...........................> 2
CONFIGURATION OF TEST HEAD 1
PE BOARD 0.NOT EXIST
1. EXIST
DR PIN 1A1 1A5 17A1 25A1
CHILD A,B ....> 1 1 1 1
CHILD C,D ....> 1 1 1 1
IO PIN 33A1 97A1 33A5 97A5
CHILD A,B ....> 1 1 1 1
CHILD C,D ....> 1 1 1 1
CONFIGURATION OF TEST HEAD 2
PE BOARD 0.NOT EXIST
1. EXIST
DR PIN 1A1 1A5 17A1 25A1
CHILD A,B ....> 1 1 1 1
CHILD C,D ....> 1 1 1 1
IO PIN 33A1 97A1 33A5 97A5
CHILD A,B ....> 1 1 1 1
CHILD C,D ....> 1 1 1 1
CONFIGURATION OF DPU
TEST HEAD 1 DC CONFIGURATION [1-32] ...........> 1-32
PPS CONFIGURATION [1-128] ..........> 1-64,97-118
TEST HEAD 2 DC CONFIGURATION [1-32] ...........> 1-32
PPS CONFIGURATION [1-128] ..........> 1-64,97-118
AC FREQUENCY (Hz) [50,60] ........................> 50
CONFIGURATION OF FTU
FLASH OPTION [Y,N] ...........................> NO
CONFIGURATION OF FM
NUMBER OF FMRA BOARD [0-8] ...........................> 8
SIZE OF FMRA BOARD [1:8G,2:16G] ....................> 2
PM(PATTERN MEMORY) BOARD EXIST [Y,N] .................> YES
SIZE OF PM BOARD [1:1G,2:2G] .....................> 2
CONFIGURATION OF MRA
MRA4 EXIST [Y,N] .....................................> YES
RCPU STN1 A-D EXIST [Y,N] .......................> YES
RCPU STN2 A-D EXIST [Y,N] .......................> YES
END SAVE.
ADVANTEST T 5372 is a versatile Final Test Equipment designed to meet the stringent demands of contemporary semiconductor production. This system is capable of testing both very high speed and very sensitive devices used in applications such as automotive, communication, consumer electronics, and other emerging applications. It enables the highest quality testing with its renowned performance, flexibility, and reliability. ADVANTEST T5372 is equipped with a powerful test head controller and a distributed arm architecture. The test head controller employs a Windows-based PC to perform unit governing functions, and the distributed arm architecture supports up to five testheads. This setup allows users to configure their machine to meet specific and changing test needs. For example, users can configure multiple testhead controllers with signal routing and multiplexers, creating efficient high test resource utilization. T 5372 also provides capability for automated testing. It can automate test sequencing, test parameter selection, and test results management. It is capable of controlling multiple sites with multiple test head configurations, and it can run in manual, semi-autonomous, or fully autonomous test modes. Additionally, the tool is equipped with a barcode reader for tracking wafer-level information, allowing users to easily keep track of multiple devices undergoing testing. It is also capable of controlling a variety of test instruments, such as oscilloscopes, power supplies, and scan testers. The asset is engineered to provide high quality testing that is reliable and repeatable. It supports the two most commonly used interface protocols - SPI and JTAG - allowing enhanced test coverage for semiconductor devices. Furthermore, it can detect physical device state, providing improved fault diagnosis. It also offers multiple test techniques to cover all of the user's testing needs, such as HiPot, in-circuit functional test, and external device protection/circuit tester. T5372 is an outstanding solution for final test purposes. It is designed to provide the highest quality testing in modern day production environments with its reliable performance, flexible architecture, and sophisticated test capabilities.
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