Used ADVANTEST T 5372 #9266429 for sale

ADVANTEST T 5372
Manufacturer
ADVANTEST
Model
T 5372
ID: 9266429
Vintage: 2008
Tester 2008 vintage.
ADVANTEST T 5372 is a cost-effective, multi-function final test equipment designed for advanced electronics chip testing. It enables high-speed test for a full range of devices and packages, including flash memory, analog and digital ICs, and more. Offering a suite of advanced test technology options, ADVANTEST T5372 provides capabilities for parametric and final test, using both inline and laser-based solutions. The system offers high-speed performance in a space-efficient design and is compatible with a range of devices, including flip-chip BGA, DDR, and SOI designs. The advanced dual-in-line probe patterning technology reduces the number of active test pins required, while its integrated motion control unit reduces cycle time. Its high-precision temperature control of up to +/-0.001 enable dependable test accuracy. The advanced automation features of T 5372 enable easy setup and management of multiple tests. The automatic sample exchange interface facilitates efficient testing of various device types in one configureable unit, while comprehensive software packages provide for flexible operations and high-speed data collection. Additionally, the automated test diagnostics enable detection and troubleshooting of device-level errors while testing. In addition to providing cost-effective testing solutions, T5372 also gives users access to its pXI-based option slot, allowing high-performance testing of a range of devices, with 100MHz switching speed and μsec accuracy. The machine also offers an extensive range of test interfaces, along with a library of test algorithms to provide easy test program development and customization. ADVANTEST T 5372 delivers cost-effective, high-speed, and accurate testing solutions for even the most demanding applications. Its advanced features, combined with its comprehensive suite of test options, make it an ideal choice for achieving high-production yields and dependable pass/fail results.
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