Used ADVANTEST T 5375 #162944 for sale

Name: ADVANTEST T 5375
Brand: ADVANTEST
SKU: 162944
Availability: InStock

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Final Test

Manufacturer

ADVANTEST

Model

T 5375

ID: 162944

Memory test system CONFIGURATION OF TEST HEAD PIN CONFIGURATION 1.512DR+ 320I/O(QUARTER) 2.1024DR+ 640I/O(HALF) 3.1536DR+ 640I/O(FULL) 4.2048DR+ 640I/O(FULL) 5.1536DR+1280I/O(FULL) 6.2048DR+1280I/O(FULL) [1-6] ...> 6 NUMBER OF TEST HEAD [1,2] ...........................> 2 CONFIGURATION OF TEST HEAD 1 PE BOARD 0.NOT EXIST 1. EXIST DR PIN 1A1 1A5 17A1 25A1 CHILD A,B ....> 1 1 1 1 CHILD C,D ....> 1 1 1 1 CHILD E,F ....> 1 1 1 1 CHILD G,H ....> 1 1 1 1 IO PIN 33A1 97A1 33A5 97A5 CHILD A,B ....> 1 1 1 1 CHILD C,D ....> 1 1 1 1 CHILD E,F ....> 1 1 1 1 CHILD G,H ....> 1 1 1 1 CONFIGURATION OF TEST HEAD 2 PE BOARD 0.NOT EXIST 1. EXIST DR PIN 1A1 1A5 17A1 25A1 CHILD A,B ....> 1 1 1 1 CHILD C,D ....> 1 1 1 1 CHILD E,F ....> 1 1 1 1 CHILD G,H ....> 1 1 1 1 IO PIN 33A1 97A1 33A5 97A5 CHILD A,B ....> 1 1 1 1 CHILD C,D ....> 1 1 1 1 CHILD E,F ....> 1 1 1 1 CHILD G,H ....> 1 1 1 1 CONFIGURATION OF DPU TEST HEAD 1 DC CONFIGURATION [1-64] ...........> 1-64 PPS CONFIGURATION [1-256] ..........> 1-256 TEST HEAD 2 DC CONFIGURATION [1-64] ...........> 1-64 PPS CONFIGURATION [1-256] ..........> 1-256 AC FREQUENCY (Hz) [50,60] ........................> 60 CONFIGURATION OF FTU FLASH OPTION [Y,N] ...........................> YES CONFIGURATION OF FM NUMBER OF FMRA BOARD [0-16] ..........................> 16 SIZE OF FMRA BOARD [0:0G,1:1.44G,2:2.88G] ..........> 1 TYPE OF CFM [1:TYPE-1,2:TYPE-2] .............> 1 PM(PATTERN MEMORY) BOARD EXIST [Y,N] .................> YES SIZE OF PM BOARD [1:1G,2:2G] .....................> 1 CONFIGURATION OF MRA MRA4 EXIST [Y,N] .....................................> NO.

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ADVANTEST T 5375 is an integrated Final Test Equipment developed by ADVANTEST Corporation, the global leader in semiconductor test solutions. The system is based on the latest Silicon Test Platform (SIP) technology, providing a flexible and cost effective capability for a wide range of test requirements for various microprocessors, memory and logic devices. ADVANTEST T5375 includes a mainframe and a number of cartridges that provide the flexibility to support a broad range of devices. The mainframe consists of two host computer systems, including a Windows based GUI unit and a PXI-based distributed instrumentation machine. This allows for host-level control of all testing activity, including configuration and data collection. Additionally, T 5375 has multiple integrated test interfaces supporting high speed, low voltage and standard testing and burn-in tasks. T5375 tool uses a number of different test instruments and technologies. The asset has an integrated model-level test which provides comprehensive fault coverage. The test equipment is based on the SIP architecture, which is optimized to support testing of high pin count devices. This includes low voltage testing, a number of burn-in tests, probes and accessories. The system can be programmed to perform multiple types of tests such as high voltage testing, clock source, pad programmable and proprietary tests. The unit includes a number of additional features such as a programmable oscilloscope for debugging purposes. Additionally, ADVANTEST T 5375 has integrated data collection and analysis, allowing users to produce and analyze test data in real-time. This allows users to quickly and accurately identify root causes of failed and marginal device performance, helping to reduce the number of unnecessary repairs and improve field yields. ADVANTEST T5375 is an advanced testing solution for a variety of microprocessors, memories and logic devices. With its advanced features and integrated machine-level testing and debugging capabilities, it is a powerful and cost-effective solution for any semiconductor test need.