Used ADVANTEST T 5375 #9123525 for sale

ADVANTEST T 5375 "final test equipment" is a system designed to perform final tests and analysis of semiconductor devices. The unit uses a combination of high speed tester and automated handlers to test over 700 devices per hour. A variety of tests is performed, including wafer sort, X-Y measurements, die/wafer evaluation, burn in, and temperature/humidity testing. Additionally, programming such as fuse and laser trimming can be done through ADVANTEST T5375. The machine has two independent high speed testers, each with 4-channel measurements for up to 4 devices at a time. Operating temperatures range between 0-55 degrees Celsius, and due to tool flexibility it can be used for a variety of test structures such as conventional wafer testing, product testing, device characterization, and failure analysis. The asset also features a total of 30 MEM testing channels and 10 logic probe channels, as well as the ability to configure a variety of linear and time domain measurement functions. T 5375 allows for full parallel testing of a wafer simultaneously, making it a very efficient model. With its high speed data accumulation and analysis, test times are greatly reduced in comparison with traditional wafer testing methods. Additionally, the equipment automatically detects device failure and can be configured to re-test the failed device. The system also includes a variety of state-of-the-art features, such as a fast ATE handler, a fully automated verification process, a data acquisition and analysis unit, and a post-processor for driving the test operation. Its graphical user interface is very user-friendly and intuitive, with an impressive array of features including online data analysis, external calibration, and limit setting. Overall, T5375 is an excellent choice for final testing and analysis of semiconductor devices. It is efficient, fast, and highly configurable, with a wide range of features and a user-friendly GUI. Additionally, it provides exceptional accuracy, making it an ideal machine for a variety of test scenarios.