Used ADVANTEST T 5375 #9158916 for sale

ADVANTEST T 5375 is a final test equipment designed for high-speed, high-accuracy testing of complex, high-pin-count semiconductor devices. The system is designed to increase yields and reduce cost through its combination of advanced technologies that enable it to achieve high-volume high-speed testing. At the heart of the unit is the Smart-SASS tester, which offers high-resolution testing capabilities over a wide range of temperature and voltage ranges. It also has a rapidly expanding library of probing solutions, selected for their superior mechanical stability and accuracy. The machine is controlled by a powerful, intuitive, easy-to-use Windows-based software suite, which provides a central point for the development, debug, and storage of device test programs. It also provides an interface for controlling the operation of the Smart-SASS Tester and other components of the tool. ADVANTEST T5375 offers support for complex DFT labeling schemes and easily reconfigurable test structures, making it ideal for working with high-pin-count devices. In addition, the asset provides support for high-speed probing and calibration, allowing for quick identification and correction of defective devices within high-volume production environments. The model makes use of a number of additional technologies that enhance its test capabilities. This includes a High-Speed Clock Generator, which ensures that device blanks can be tested at very high speeds for high-volume manufacturing; an On-Screen Reference Grid, which is used for wafer-level parametric testing; and On-Wafer Probe, which increases test accuracy by precisely locating device blanks for testing. Furthermore, the equipment has a built-in Temperature Simulation Set which enables a variety of temperature conditions to be simulated, offering a more accurate representation of performance in the real world. Overall, T 5375 is a powerful, cost-effective test solution that provides high-volume, high-accuracy testing of semiconductor devices. By combining advanced technologies with a range of test support features, the system is designed to help reduce costs and increase yield while still meeting the highest standards of accuracy and reliability.