Used ADVANTEST T 5375 #9166525 for sale
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ID: 9166525
Vintage: 2002
Memory tester
Single head
Configuration of test head
Pin configuration
512DR+ 320I/O(QUARTER)
1024DR+ 640I/O(HALF)
1536DR+ 640I/O(FULL)
2048DR+ 640I/O(FULL)
1536DR+1280I/O(FULL)
2048DR+1280I/O(FULL) [1-6] ...> 6
NUMBER OF TEST HEAD [1,2] ...........................> 1
CONFIGURATION OF TEST HEAD 1
PE BOARD 0.NOT EXIST
1. EXIST
DR PIN 1A1 1A5 17A1 25A1
CHILD A,B ....> 1 1 1 1
CHILD C,D ....> 1 1 1 1
CHILD E,F ....> 1 1 1 1
CHILD G,H ....> 1 1 1 1
IO PIN 33A1 97A1 33A5 97A5
CHILD A,B ....> 1 1 1 1
CHILD C,D ....> 1 1 1 1
CHILD E,F ....> 1 1 1 1
CHILD G,H ....> 1 1 1 1
CONFIGURATION OF DPU
TEST HEAD 1 DC CONFIGURATION [1-64] ...........> 1-64
PPS CONFIGURATION [1-256] ..........> 1-256
AC FREQUENCY (Hz) [50,60] ........................> 50
CONFIGURATION OF FTU
FLASH OPTION [Y,N] ...........................> NO
CONFIGURATION OF FM
NUMBER OF FMRA BOARD [0-16] ..........................> 0
PM(PATTERN MEMORY) BOARD EXIST [Y,N] .................> No
SIZE OF PM BOARD [1:1G,2:2G,3:4G,4:9G] ...........> 1
CONFIGURATION OF MRA
MRA4 EXIST [Y,N] .....................................> NO
2002 vintag
ADVANTEST T 5375 is a Final Test Equipment used in the chip production process to ensure completed chips are functional and will meet customer's requirements. It is used in large-scale wafer probers, where a huge quantity of chips can be tested in short time frames. The system has powerful and versatile test functions that enable easy testing of high-volume memory devices such as SRAMs, DRAMs, and Flash. ADVANTEST T5375 includes an enhanced test control architecture, test access systems for more reliable programs, and automated test pattern generation capabilities. It can also incorporate result analysis functions to evaluate test results for various problems. The easy-to-learn interface allows for a quick adoption, while also enabling engineers to gain valuable test data that can be used to refine and optimize the test process. T 5375 is loaded with powerful hardware capabilities for meeting a wide range of test needs. The unit includes a high-speed No-Wait Time (NWT) mezzanine card with an 8-channel, 64-bit open-MCTest interface for fast parallel access of multiple chips and the Advanced hardware Trigger (AHT) machine which speeds up the on-wafer test time. It also utilizes advanced memory-card-architecture which includes advanced DSP cards, 603PPC Field-Programmable Gate Array (FPGA) for the control unit, and an SRAM device interface for all memory devices. T5375 also utilizes high-precision, linear-positioning technology to allow for accurate position control during the testing process. This technology enables precise alignment and positioning of probes to ensure reliable wafer alignment. Moreover, ADVANTEST T 5375 can be easily programmed to manage process variation and provide accurate test results with minimal variability for a wide variety of products and processes. In addition, ADVANTEST T5375 incorporates comprehensive test environment management functions, including real-time JTAG support for easy handling of test set-ups and programming. The test environment is also equipped with automated test-parameter-checking and test-result-based-parameter-tuning to ensure that each chip is tested with the same parameters. T 5375 can execute tests on multiple samples at the same time, providing maximum throughput and productivity. Overall, T5375 is a powerful and reliable Final Test Tool for ensuring correct test results and validating that each chip meets customer requirements. Its versatile feature set and advanced functions allow chip manufacturers to maximize speed, efficiency, and test accuracy. It is the perfect solution for delivering quality products in today's highly competitive market.
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