Used ADVANTEST T 5375 #9181104 for sale

Name: ADVANTEST T 5375
Brand: ADVANTEST
SKU: 9181104
Availability: InStock

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Final Test

Manufacturer

ADVANTEST

Model

T 5375

ID: 9181104

Memory tester /DIAG/G SYSTEM CONFIGURATION GENERATE CONFIGURATION OF TEST HEAD PIN CONFIGURATION 1.512DR+ 320I/O(QUARTER) 2.1024DR+ 640I/O(HALF) 3.1536DR+ 640I/O(FULL) 4.2048DR+ 640I/O(FULL) 5.1536DR+1280I/O(FULL) 6.2048DR+1280I/O(FULL) [1-6] ...> 6 NUMBER OF TEST HEAD [1,2] ...........................> 1 CONFIGURATION OF TEST HEAD 1 PE BOARD 0.NOT EXIST 1. EXIST DR PIN 1A1 1A5 17A1 25A1 CHILD A,B ....> 1 1 1 1 CHILD C,D ....> 1 1 1 1 CHILD E,F ....> 1 1 1 1 CHILD G,H ....> 1 1 1 1 IO PIN 33A1 97A1 33A5 97A5 CHILD A,B ....> 1 1 1 1 CHILD C,D ....> 1 1 1 1 CHILD E,F ....> 1 1 1 1 CHILD G,H ....> 1 1 1 1 CONFIGURATION OF DPU TEST HEAD 1 DC CONFIGURATION [1-64] ...........> 1-64 PPS CONFIGURATION [1-256] ..........> 1-256 TEST HEAD 2 DC CONFIGURATION [1-64] ...........> 0 PPS CONFIGURATION [1-256] ..........> 0 AC FREQUENCY (Hz) [50,60] ........................> 60 CONFIGURATION OF FTU FLASH OPTION [Y,N] ...........................> YES CONFIGURATION OF FM NUMBER OF FMRA BOARD [0-16] ..........................> 0 PM(PATTERN MEMORY) BOARD EXIST [Y,N] .................> NO CONFIGURATION OF MRA MRA4 EXIST [Y,N] .....................................> NO END SAVE.

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ADVANTEST T 5375 is a high-performance final test equipment designed for use in the production of sophisticated semiconductor devices. This system is capable of performing comprehensive testing of packaged and bare die integrated circuits with its multi-site automatic handler, tester, and thermal shock chamber. ADVANTEST T5375 supports full testing capability from digital, mixed-signal, and analog test formats in a single unit. The full vector digital test capabilities are provided by a vector step programmable memory unit that supports JTAG, IEEE 1149.1,and IEEE 1149.6 protocols. The mixed-signal capabilities are provided by an analog/mixed-signal tester with an exclusive dynamic parametric test machine, which allows high-speed analog and digital testing. The tool also supports in-asset programming and performance verification. T 5375 offers a user-friendly graphical operator interface, with a variety of automated testing functions. This interface allows for seamless integration with the customer's production line and external database systems, such as process control or diagnostic systems. It supports flexible test scheduling, full parameterization, multiple test programs, data logging, real-time reporting and trending, customizable data presentation and reporting, and a wide range of parameter recalls. T5375 is also equipped with a multi-site automatic handler to quickly set up and process multiple configurations of devices under test. This handler is capable of handling bare die up to 3.2mm in size, with up to 160 devices per tray. It also supports high-precision assembly and mounting operations in handling chips, frames, boards, and fixtures. ADVANTEST T 5375 also features an automated thermal shock chamber that allows testing of devices over a wide range of temperatures. The chamber has an advanced multi-programming capability, allowing test runs of up to 32 tests to be programmed and stored for easy retrieval. This feature allows for rapid and robust performance testing of ICs for use in automotive, medical, aerospace, and other extreme temperature environments. Overall, ADVANTEST T5375 provides a comprehensive, automated solution for the testing of integrated circuits, making it an attractive option for companies that require extensive testing. With its extensive list of features, this final test model is an ideal choice for semiconductor device production.