Used ADVANTEST T 5375 #9262805 for sale

Name: ADVANTEST T 5375
Brand: ADVANTEST
SKU: 9262805
Availability: InStock

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Final Test

Manufacturer

ADVANTEST

Model

T 5375

ID: 9262805

Memory tester With test head CONFIGURATION OF TEST HEAD PIN CONFIGURATION 1.512DR+ 320I/O(QUARTER) 2.1024DR+ 640I/O(HALF) 3.1536DR+ 640I/O(FULL) 4.2048DR+ 640I/O(FULL) 5.1536DR+1280I/O(FULL) 6.2048DR+1280I/O(FULL) [1-6] ...> 6 NUMBER OF TEST HEAD [1,2] ...........................> 1 TYPE OF DR PE [1:DR PE, 2:24CH HVDR PE] .............> 1 CONFIGURATION OF TEST HEAD 1 PE BOARD 0.NOT EXIST 1. EXIST DR PIN 1A1 1A5 17A1 25A1 CHILD A,B ....> 1 1 1 1 CHILD C,D ....> 1 1 1 1 CHILD E,F ....> 1 1 1 1 CHILD G,H ....> 1 1 1 1 IO PIN 33A1 97A1 33A5 97A5 CHILD A,B ....> 1 1 1 1 CHILD C,D ....> 1 1 1 1 CHILD E,F ....> 1 1 1 1 CHILD G,H ....> 1 1 1 1 CONFIGURATION OF DPU TEST HEAD 1 DC CONFIGURATION [1-64] ...........> 1-64 PPS CONFIGURATION [1-256] ..........> 1-256 AC FREQUENCY (Hz) [50,60] ........................> 60 CONFIGURATION OF FTU FLASH OPTION [Y,N] ...........................> NO CONFIGURATION OF FM NUMBER OF FMRA BOARD [0-16] ..........................> 0 PM(PATTERN MEMORY) BOARD EXIST [Y,N] .................> NO CONFIGURATION OF MRA MRA4 EXIST [Y,N] .....................................> NO.

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ADVANTEST T 5375 Final Test Equipment is a reliable and efficient test system used for the inspection and verification of integrated circuits, board-level devices, and any components requiring test verification. It features a wide range of options for high-precision and fast-speed performance. The test unit offers a modular platform for fast, flexible, and accurate device testing. It is capable of testing wide range of technologies such from Small Outline Transistors (SOI), Ball Grid Array (BGA), and Multi-Level Chip Scale Packaging (MLCCS). It also features a full suite of diagnostic utilities and automated testing capabilities. ADVANTEST T5375 is built with a high-speed universal interface protocol (UIP) that enables it to interface with a variety of external equipment such as Automatic Test Equipment (ATE), In-circuit Testing (ICT) equipment, and integrated development platforms. It also provides customizable probes for performance optimization. Its flexible environment supports automation and customization for both hardware-in-the-loop (HIL) and software-in-the-loop (SIL) testing. The impedance mode of thetesters offers advanced functional and electrical testing of integrated circuits. This enables the flexibility to adjust the probes' frequency, sweep time, test vector, and voltage settings. The Automatic Test Pattern Generator (ATPG) allows for the generation of custom test patterns that can be easily loaded into the machine for more black-box level troubleshooting. T 5375 includes a flexible calibration tool engineered for mechanical repeatability and accuracy. The calibration asset can be used to adjust the parameters of the various test settings. It helps to ensure that the testers provide precise results for all devices being tested. T5375 is designed with superior safety measures such as floating power supply, protective accessories, temperature contours and other safeguards for protection against overvoltage and power surges. ADVANTEST T 5375 is ideal for model-level simulation and functional testing on applications such as Automotive, Mobile Devices, Consumer Electronics, Industrial and other highly demanding application fields. It combines high-speed performance with precision and accuracy for reliable device testing. As an efficient and cost-effective test equipment, ADVANTEST T5375 has been widely used by manufactures and engineers for a range of different testing applications.