Used ADVANTEST T 5375 #9277246 for sale
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ID: 9277246
Dual head tester
SYSTEM CONFIGURATION GENERATE
CONFIGURATION OF TEST HEAD
PIN CONFIGURATION 1. 512DR+ 320I/O(QUARTER)
2.1024DR+ 640I/O(HALF)
3.1536DR+ 640I/O(FULL)
4.2048DR+ 640I/O(FULL)
5.1536DR+1280I/O(FULL)
6.2048DR+1280I/O(FULL) [1 -6] ...> 6
NUMBER OF TEST HEAD [1,2] ...........................> 2
CONFIGURATION OF TEST HEAD 1
PE BOARD 0.NOT EXIST
1. EXIST
DR PIN 1A1 1A5 17A1 25A1
CHILD A,B ....> 1
CHILD C,D ....> 1
CHILD E,F ....> 1
CHILD G,H ....> 1
IO PIN 33A1 97A1 33A5 97A5
CHILD A,B . ...> 1
CHILD C,D ....> 1
CHILD E,F ....> 1
CHILD G,H ....> 1
CONFIGURATION OF TEST HEAD 2
PE BOARD 0.NOT EXI ST
1. EXIST
DR PIN 1A1 1A5 17A1 25A1
CHILD A,B ....> 1
CHILD C,D ....> 1
CHILD E,F ....> 1
CHILD G,H ....> 1
IO PIN 33A1 97A1 33A5 97A5
CHILD A,B ....> 1
CHILD C,D ....> 1
CHILD E ,F ....> 1
CHILD G,H ....> 1
CONFIGURATION OF DPU
TEST HEAD 1 DC CONFIGURATION [-64] ...........> 1 -64
PPS CONFIGURATION [1 -256] ..........> 1 -256
TEST HEAD 2 DC CONFIGURATION [1 -64] ...........> 1 -64
PPS CONFIGURATION [1 -256] ..........> 1 -256
AC FREQUENCY (Hz) [50,60] ........................> 60
CONFIGURATION OF FTU
FLASH OPTION [Y,N] ...........................> YES
CONFIGURATION OF FM
NUMBER OF FMRA BOARD [0 -16 ] ..........................> 8
PM(PATTERN MEMORY) BOARD EX IST [Y,N] .................> NO
CONFIGURATION OF MRA
MRA4 EXIST [Y,N] .....................................> NO
END SAVE.
ADVANTEST T 5375 is a powerful final test equipment designed for testing a wide range of electronic components. It can be used to carry out comprehensive tests on individual components, as well as on assemblies or modules. The system is comprised of multiple instruments, including high-speed digital oscilloscopes, wafer probers, and mass-terminal stations. The unit's digital oscilloscope is designed for dynamic parametric testing, functioning with bandwidth up to 500 MHz. It is connected to a high-speed data acquisition unit with direct memory access, which ensures no data is lost during testing. The machine can perform a variety of measurements such as frequency, time interval, rectangular signal, level setting, and pulse response, among others. ADVANTEST T5375 is connected to wafer probers, allowing for automated testing of semiconductor devices on their wafers. With this tool, users can take measurements on specific die locations, or measure across device boundaries. The asset is also equipped with mass-terminal stations, which include an X-Y drive base and a Z-axis drive stage for precision. This allows for high levels of accuracy during measurements on packaged DUTs. The model includes software specifically designed for its usage, which enables full control of the equipment as well as the instruments connected to it. It has various capabilities that are tailored for particular testing needs, such as test set-up, device handling, and result analysis. Additionally, this software is designed to be highly flexible, allowing users to customize it according to their own specifications for various types of test projects. T 5375 caters to a variety of testing requirements, making it a comprehensive solution for final testing. It combines advanced hardware and software, allowing users to perform precise measurements and data acquisition. It is a reliable and efficient system for validating the integrity and functioning of a wide variety of electronic components.
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