Used ADVANTEST T 5375 #9396775 for sale

ADVANTEST T 5375 Final Test Equipment is a high-end automated ATE (Automatic Test Equipment) system that provides comprehensive, repeatable production testing for complex, high-volume semiconductor devices. This unit is reliable, robust, and highly configurable for a wide range of semiconductor devices, with a density up to 810 UPH (Units per Hour). It is a non-invasive multiple-site test machine that supports up to 28 analog and/or digital test sites. The ADANVANTEST ADVANTEST T5375 Final Test tool includes a wide variety of features to ensure efficient testing. It includes analog and digital test systems with high-speed data acquisition for testing ICs with up to 8 sites at the same time. In addition, it provides versatile Total Solution Software packages, in-depth device data analysis, support for many packaging formats, non-stop testing for mixed devices, and a customizable parameter list. It also includes many automated calculation functions that ensure optimization of operational parameters and increase reliability. The performance of T 5375 Final Test Asset is exceptional. It offers a high-speed testing capability, and a high throughput of up to 1.2 GHz for parallel tests. It also allows for a wide range of test parameters and procedures, with solutions such as on-the-fly level and timing correction, and sampling rate selection. Additionally, with its advanced fault diagnostics and analysis functions, it is capable of creating detailed test reports to better understand the device under test. For further operational improvement, T5375 Final Test Model offers comprehensive process control and monitoring features. It includes support for the TCMs high-speed data acquisition and processing, and a variety of other process control packages. Its automated process control package enables complete A/D conversion and parameter monitoring, which is essential for efficient testing and compliance with established standards. All in all, ADVANTEST T 5375 Final Test Equipment is a powerful ATE system that can deliver fast, reliable test results for high-volume semiconductor devices. It is highly configurable and offers comprehensive test solutions for a variety of ICs and packages. It has a user-friendly interface, high-speed testing capabilities, and excellent process control and monitoring features. It is suitable for both production and prototyping applications, and it is an excellent choice for testing high-volume semiconductor devices.