Used ADVANTEST T 5376 #293738676 for sale

ADVANTEST T 5376 is a highly advanced Final Test equipment designed for ultrafast testing of various components. It is an all-in-one, Automated Test Cell for DDR, Flash, DRAM, SRAM and other types of semiconductor products. The system components of ADVANTEST T5376 unit include a mainframe, Multi-Frame Control Unit (MCU), Tape File Server (TFS), Test Bed Master, Probe Interface Unit (PIU), and a Network Interface Unit (NIU). The mainframe consists of two main parts - the Machine Controller Unit (SCU) and a Mass Memory Storage (MMS). The Mass Memory Storage contains the Multi-Component Setup (MCS) software, which is used to configure and program the test tool. The Multi-Frame Control Unit (MCU) is used to control the various test beds. It includes three separate Cores and is responsible for the automatic testing of components by controlling their movements, their power-on/power-off, the current and voltage levels as well as their connections. The Test Bed Master is used to synchronize and control the various test beds in T 5376 asset. It communicates with the PIU and the Test Bed Master Module connected to the MCU. The Probe Interface Unit (PIU) is used to collect and manage all measurements and provide an interface between the test bed and the model controller. The PIU is responsible for fast data processing and can be upgraded by using different types of probe cards. The Network Interface Unit (NIU) is used to connect to the LAN and provides communication between the test stations and other test systems. Finally, a TFS (Tape File Server) is connected to the test station and is responsible for storing the results of the tests. In summary, T5376 Final Test Equipment is an all-in-one, Automated Test Cell specifically designed for high speed testing of components. Its performance is optimized through the use of an efficient SCU, the Multi-Frame Control Unit, a Test Bed Master, and a Network Interface Unit. Furthermore, its performance can be fine-tuned and upgraded easily by using different types of probe cards.