Used ADVANTEST T 5376 #9250315 for sale
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ID: 9250315
Memory tester
CPU Type: SPARC
Compressed air consumption: 5-10 Nl/Min
Compressed air requirement: 0.49 MPa-0.69 MPa
Power consumption: 30 kVA
Power requirement: 200 VAC, 3-Phase
Product / P/N / Revision / Title
ASXUBASE / PASX51-75**** / 2.04 / SunOS Release 5.8
ATW51SU / PASX51-75**** / 6.04B / ATLworks for T5500 Series
DIAG5375SU / PASX51-75**** / 1.04B / Tester Diagnosis (T5375/T5376)
SYSTEST51SU / PASX51-75**** / 6.04B / ADI/SYS TEST (T5581 Series)
TESTUTL51SU / PASX51-75**** / 6.04B / Tester Utilities (T5581 Series)
SYSTEM CONFIGURATION LIST
SYSTEM IDENTIFICATION SPNxx
CONFIGURATION OF TEST HEAD
PIN CONFIGURATION 1. 512DR+ 320I/O(QUARTER)
2.1024DR+ 640I/O(HALF)
3.1536DR+ 640I/O(FULL)
4.2048DR+ 640I/O(FULL)
5.1536DR+1280I/O(FULL)
6.2048DR+1280I/O(FULL) [1-6] ...> 6
NUMBER OF TEST HEAD [1,2] ...........................> 1
CONFIGURATION OF TEST HEAD 1
PE BOARD 0.NOT EXIST
1. EXIST
DR PIN 1A1 1A5 17A1 25A1
CHILD A,B ....> 1 1 1 1
CHILD C,D ....> 1 1 1 1
CHILD E,F ....> 1 1 1 1
CHILD G,H ....> 1 1 1 1
IO PIN 33A1 97A1 33A5 97A5
CHILD A,B ....> 1 1 1 1
CHILD C,D ....> 1 1 1 1
CHILD E,F ....> 1 1 1 1
CHILD G,H ....> 1 1 1 1
CONFIGURATION OF DPU
TEST HEAD 1 DC CONFIGURATION [1-64] ...........> 1-64
PPS CONFIGURATION [1-256] ..........> 1-256
AC FREQUENCY (Hz) [50,60] ........................> 50
CONFIGURATION OF FTU
FLASH OPTION [Y,N] ...........................> YES
CONFIGURATION OF FM
NUMBER OF FMRA BOARD [0-16] ..........................> 8
SIZE OF FMRA BOARD [1:1.44G] .......................> 1
TYPE OF CFM [1:TYPE-1,2:TYPE-2] .............> 1
PM(PATTERN MEMORY) BOARD EXIST [Y,N] .................> YES
SIZE OF PM BOARD [1:1G] ..........................> 1
CONFIGURATION OF MRA
MRA4 EXIST [Y,N] .....................................> NO.
ADVANTEST T 5376 is a final test equipment from ADVANTEST that differs from many other test systems due to its high speed and low power consumption. This system is powered by a Windows based workstation with a number of features specific to high-speed testing, such as the ability to modify test parameters, monitor individual production lines, and manage data collection from multiple production runs. ADVANTEST T5376 is equipped with a variety of I/O and software capabilities to support its functionality. With its integrated general-purpose I/O, the unit is capable of controlling, monitoring, and testing high-speed parts and assemblies with a fast response time. It also has an eight-point digital I/O controller, which enables it to test multiple circuits from the same source. Additionally, RS-232/RS-422 ports allow for interfacing with a wide variety of external devices. The machine is designed as a single-site, stand-alone test station, which is capable of handling a variety of jobs with its advanced hardware and software. In addition to the standard conventional test unit, the tool also comes with a choice of additional options: multiple analog device support, flash tester, RF tester, memory card tester, and an Automatic ID Identification. Test programs on T 5376 are created using the Graphical User Interface (GUI) which allows developers to quickly design various testing modules for their applications. The GUI also includes user-friendly tools such as wizards, datasets, waveforms, scanners, and instrument control options. This helps to simplify the process of designing and debugging the programs. The embedded programming languages of T5376 include PL/I, BASIC, and Pascal to optimize script-building and speed up testing operations. It also features an embedded C++ interpreter, making it possible to program complex algorithms at a faster speed. In addition, the asset is highly configurable in order to adjust to most types of application require. It is powered by an Intel Core 2 quad processor and offers numerous communications and memory options, such as two PCI-E slots, USB ports, Ethernet, and serial interfaces. Due to its high speed, low power consumption, and ease of programmability, ADVANTEST T 5376 is an ideal final test model for many high-speed tests and applications. This equipment allows customers to reduce costs while improving test processes.
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