Used ADVANTEST T 5377 #293593173 for sale

ADVANTEST T 5377 Final Test Equipment is a versatile solution designed to accurately test a wide range of modern semiconductor devices. It is a fully-integrated tester that provides simultaneous multi-pin, multi-site testing capabilities with enhanced capabilities. The flexible platform consists of an automated load board and test head assembly, a control station, and an array of digital sources and measurement devices. This solution is tailored for each customer's individual purpose in mind and its modular design allows for quick and easy maintenance for reduced downtime. The test head assembly can handle up to 128 inputs/outputs and 36 sources, enabling high speed and parallel operation. The inputs are suitable for a variety of device types such as memory, logic, and analog, and a wide range of VLSI applications. It also features advanced NAND, NOR, SRAM, DRAM, IF, DSP, and analog device testing capabilities. The test head is designed with automated identification capabilities which allow the system to detect any changes to the device under test. This feature ensures it can quickly adapt and provide reliable results in the midst of any changing topology. It also incorporates a range of highly precise measurement instruments and thermal sensors to help identify anomalies in device performance. The control station is equipped with an advanced user-friendly graphical user interface (GUI) which makes operation more efficient. It is designed to facilitate high-speed data processing and record precise measurements quickly with minimal effort. It also allows for remote diagnostics and scheduling of tests. The unit is built with a quality assurance machine and electronic test management (ETM) tool, which simplifies and speeds up the entire test process and allows for improved quality assurance. It also includes a range of advanced communication methods, enabling easy sharing of test results with other parts of the design chain. ADVANTEST T5377 Final Test Asset is an effective solution for a variety of device test applications. Its comprehensive design provides reliable results in minimal time, making it an efficient solution for any semiconductor testing needs.